
Proceedings Paper
Real-time optical inspection of plated relay contactsFormat | Member Price | Non-Member Price |
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Paper Abstract
An inspection system has been developed to improve both the reliability and the yield of surface treated components. Digitized data streams from photo detectors are fed into a hybrid DSP/multi-processor transputer system. The photo detectors collect scattered light from twin laser scanners (one scanner for each side of the relay contact). For real time operation the system inspects up to 10 contacts per second, finding defects as small as 5 (mu) in raw combined data streams totaling approximately 20 Mbyte/sec. The inspection system is currently inspecting the surfaces of plated relay contacts on the factory floor. This paper describes the inspection system with emphasis on the constraints imposed by the requirement for real time processing of large volumes of data.
Paper Details
Date Published: 6 August 1993
PDF: 7 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150296
Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)
PDF: 7 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150296
Show Author Affiliations
Paul Healy, Trinity College (Ireland)
Kenneth Dawson, Trinity College (Ireland)
C. Kassiouras, Zenon SA (Greece)
Kenneth Dawson, Trinity College (Ireland)
C. Kassiouras, Zenon SA (Greece)
A. Ikonomopoulos, Zenon SA (Greece)
Richard Schneider, Siemens AG (Germany)
Dieter Spriegel, Siemens AG (Germany)
Richard Schneider, Siemens AG (Germany)
Dieter Spriegel, Siemens AG (Germany)
Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)
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