Proceedings Paper
Issues in the design of systems incorporating electron bombarded CCDs| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Single electron detection is desirable in systems incorporating EBCCDs. The sources of noise in single electron counting are discussed and an expression is given for the total noise.
Paper Details
Date Published: 12 July 1993
PDF: 8 pages
Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); doi: 10.1117/12.148610
Published in SPIE Proceedings Vol. 1900:
Charge-Coupled Devices and Solid State Optical Sensors III
Morley M. Blouke, Editor(s)
PDF: 8 pages
Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); doi: 10.1117/12.148610
Show Author Affiliations
Alice L. Reinheimer, Tektronix, Inc. (United States)
Published in SPIE Proceedings Vol. 1900:
Charge-Coupled Devices and Solid State Optical Sensors III
Morley M. Blouke, Editor(s)
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