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Characterization of nonlinear absorption and refraction in advanced materials
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Paper Abstract

We discuss the characterization of nonlinear optical processes in materials associated with loss and index changes using the Z-scan. The primary problem addresses is, given a new material, how do you determine the dominant nonlinearities present and their physical mechanisms. In particular, in extensive studies of a wide variety of materials we have found that there is seldom a single nonlinear process occurring. Often several processes occur simultaneously sometimes in unison, sometimes competing. Distinguishing and separating these processes is important for understanding and modeling the interaction. There are a variety of methods and techniques for determining the nonlinear optical response, each with its own weaknesses and advantages. In general it is advisable to use as many complementary techniques as possible and vary as many experimental parameters as possible in order to unambiguously determine the active nonlinearities. Here we show as examples the two cases of semiconductors and reverse saturable absorbing dyes. We concentrate on the use of the Z-scan in determining the responses, but utilize knowledge from other experiments to help in the interpretation.

Paper Details

Date Published: 23 July 1993
PDF: 16 pages
Proc. SPIE 1852, Nonlinear Optical Properties of Advanced Materials, (23 July 1993); doi: 10.1117/12.148435
Show Author Affiliations
Eric W. Van Stryland, CREOL/Univ. of Central Florida (United States)
Mansoor Sheik-Bahae, CREOL/University of Central Florida (United States)
Ali A. Said, CREOL/University of Central Florida (United States)
David J. Hagan, CREOL/University of Central Florida (United States)

Published in SPIE Proceedings Vol. 1852:
Nonlinear Optical Properties of Advanced Materials
Shahab Etemad, Editor(s)

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