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Dynamics of surface thermal expansion and diffusivity using two-color reflection transient gratings
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Paper Abstract

We report ultrafast measurements of the dynamic thermal expansion of a surface and the temperature dependent surface thermal diffusivity using a two-color reflection transient grating technique. Studies were performed on p-type, n-type, and undoped GaAs(100) samples at several temperatures. Using a 75 fs ultraviolet probe with visible excitation beams, the electronic effects that dominate single color experiments become negligible; thus surface expansion due to heating and the subsequent contraction caused by cooling provide the dominant influence on the diffracted probe. The diffracted signal was composed of two components, thermal expansion of the surface and heat flow away from the surface, allowing the determination of the rate of expansion as well as the surface thermal diffusivity. At room temperature a signal rise due to thermal expansion was observed, corresponding to a maximum average displacement of approximately equals 1 angstroms at 32 ps. Large fringe spacings were used, thus the dominant contributions to the signal were expansion and diffusion perpendicular to the surface. Values for the surface thermal diffusivity of GaAs were measured and found to be in reasonable agreement with bulk values above 50 degree(s)K. Below 50 degree(s)K, the diffusivity at the surface was more than an order of magnitude slower than in the bulk due to increased phonon boundary scattering. Comparison of the results with a straightforward thermal model yields good agreement over a range of temperatures (12 - 300 degree(s)K). The applicability and advantages of the transient grating technique for studying photothermal and photoacoustic phenomena are discussed.

Paper Details

Date Published: 24 June 1993
PDF: 13 pages
Proc. SPIE 1856, Laser Radiation Photophysics, (24 June 1993); doi: 10.1117/12.147607
Show Author Affiliations
Deanna Marie Pennington, Univ. of California/Berkeley (United States)
Charles B. Harris, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 1856:
Laser Radiation Photophysics
Bodil Braren; Mikhail N. Libenson, Editor(s)

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