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Proceedings Paper

Lifetime of BASS devices on 50-ohm video pulser circuits
Author(s): Michael H. Herman; S. M. Ahern; Larry O. Ragle; Charles S. Leung; Heikki I. Helava; Dave M. Rossi; D. Mansfield; Kenneth M. Positeri
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Paper Abstract

The reliability of the optically triggered Bulk Avalanche Semiconductor Switch (BASS) has been assessed in a variety of test conditions. For a nominal characterization diagnostic, we have adopted a 50-ohm video transmission line having a pulsewidth of 0.5 ns. At 11 kV input voltage we have found BASS lifetimes in excess of 1 Billion pulse. This level of device lifetime is a record achievement for optically triggered semiconductor switches. The reliability distribution is found to be of Weibull type. We discuss the implications of the reliability distribution and the performance of the device during lifetime evaluations.

Paper Details

Date Published: 9 June 1993
PDF: 10 pages
Proc. SPIE 1873, Optically Activated Switching III, (9 June 1993); doi: 10.1117/12.146561
Show Author Affiliations
Michael H. Herman, Power Spectra, Inc. (United States)
S. M. Ahern, Power Spectra, Inc. (United States)
Larry O. Ragle, Power Spectra, Inc. (United States)
Charles S. Leung, Power Spectra, Inc. (United States)
Heikki I. Helava, Power Spectra, Inc. (United States)
Dave M. Rossi, Power Spectra, Inc. (United States)
D. Mansfield, Power Spectra, Inc. (United States)
Kenneth M. Positeri, Power Spectra, Inc. (United States)

Published in SPIE Proceedings Vol. 1873:
Optically Activated Switching III
R. Aaron Falk, Editor(s)

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