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Proceedings Paper

Further magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry
Author(s): Anthony DiCarlo; Michael R. Scheinfein; Ralph V. Chamberlin
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Paper Abstract

We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

Paper Details

Date Published: 4 June 1993
PDF: 8 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146376
Show Author Affiliations
Anthony DiCarlo, Arizona State Univ. (United States)
Michael R. Scheinfein, Arizona State Univ. (United States)
Ralph V. Chamberlin, Arizona State Univ. (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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