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Proceedings Paper

Quantitative analysis of STM images for surface structure determination: sulfur on Re(0001)
Author(s): D. Frank Ogletree; Philippe Sautet; James C. Dunphy; Miguel Salmeron
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Paper Abstract

Scanning Tunneling Microscopy (STM) image of adsorbed atoms and molecules on single crystal substrates provide important information on surface structure and order. In many cases images are interpreted qualitatively based on other information on the system. To obtain quantitative information a theoretical analysis of the STM image is required. A new method of calculating STM images is presented that includes a full description of the STM tip and surface structure. This method is applied to experimental STM images of sulfur adsorbed on Re(0001). The effects of adsorption site, adsorbate geometry, tip composition and tunnel gap resistance on STM image contrast are analyzed. The chemical identity of the tip apex atom and the substrate subsurface structure are both shown to significantly affect STM image contrast.

Paper Details

Date Published: 4 June 1993
PDF: 12 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146367
Show Author Affiliations
D. Frank Ogletree, Lawrence Berkeley Lab. (United States)
Philippe Sautet, Lab. Chemie Theoretique/ENS Lyon (France)
James C. Dunphy, Univ. of California/Berkeley (United States)
Miguel Salmeron, Lawrence Berkeley Lab. (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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