Share Email Print

Proceedings Paper

Incorporation of a FADOF to an ESPI system
Author(s): Larryl K. Matthews; Thomas M. Shay; Gabriel V. Garcia
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) has been used for many years in nondestructive testing applications in laboratories. Field applications of ESPI systems have been limited by the need to restrict the amount of light, sunlight and other sources, during operation. Interference filters and other techniques have been tried to increase the applicability of ESPI systems in daylight environments. Each of these attempts have been moderately successful. The FADOF (Faraday Anomalous Dispersion Optical Filter) is a revolutionary filter that improves throughput, field-of-view, and the signal-to-noise ratio of the laser signal returning from the test object. This paper describes the basics of a FADOF and how the filter can be incorporated into an ESPI system.

Paper Details

Date Published: 28 May 1993
PDF: 6 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993);
Show Author Affiliations
Larryl K. Matthews, New Mexico State Univ. (United States)
Thomas M. Shay, New Mexico State Univ. (United States)
Gabriel V. Garcia, New Mexico State Univ. (United States)

Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?