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Proceedings Paper

High-precision 3D imaging using a pulsed diode laser
Author(s): Chang Da Zhang; Zheng-hua Guan; Chong Shu He; Ding Ji Shi
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Paper Abstract

Development of laser 3-D imaging is reviewed briefly in this paper. The stress is on the state of the art semiconductor laser and its potential use in 3-D imaging systems. Three methods of ranging, i.e., IM-PM, pulsed TOF, and FM-CW, are analyzed. We confirmed that it is necessary to use constant fraction discrimination (CFD) technique and high resolution timing technique in a pulsed system for obtaining high resolution ranging. The calculation of distance of reliable ranging and needed sample rate of 3-D imaging have been made. The approaches to implement high speed, high resolution counter circuitry are discussed. Ranging experiments were done using a pulsed diode laser with pulse duration of 70 ps, peak power of 1 W, and repetition rate of 200 KHZ, a Si APD with a response time of 370 ps was also used to detect the return signal, and a range counter with a time resolution of 66 ps was used to measure the distance. The experimental results show an excellent range accuracy of 1 to 2 cm in the wide dynamical range of signal amplitude.

Paper Details

Date Published: 11 May 1993
PDF: 10 pages
Proc. SPIE 1979, 1992 International Conference on Lasers and Optoelectronics, (11 May 1993); doi: 10.1117/12.144082
Show Author Affiliations
Chang Da Zhang, North China Research Institute of Electro-Optics (China)
Zheng-hua Guan, North China Research Institute of Electro-Optics (China)
Chong Shu He, North China Research Institute of Electro-Optics (China)
Ding Ji Shi, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 1979:
1992 International Conference on Lasers and Optoelectronics
Sui-Sheng Mei; Bingkun Zhou, Editor(s)

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