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Proceedings Paper

Intersection-point calculations for electron-optical devices
Author(s): Jerzy M. Woznicki; Jacek Grzegorz Puchalski
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Paper Abstract

A method for computing the intersection point of a ray in a potential field for electron-optical devices is presented. This method is applied for three or four component ray trace schemes which are based on the electron-optical analogy. The method requires only three adjacent integration points of ray trajectory where the last point is located behind the given surface. In this way the best possible accuracy for numerical ray-trace schemes of the fourth order can be obtained.

Paper Details

Date Published: 1 April 1993
PDF: 10 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142075
Show Author Affiliations
Jerzy M. Woznicki, Warsaw Univ. of Technology (Poland)
Jacek Grzegorz Puchalski, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93
LiWei Zhou, Editor(s)

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