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Proceedings Paper

Detecting defects and showing their position in a deep hole by means of CCD camera
Author(s): Muxing Liu; Zhenying Liu; Qian Mi; Binghua Su
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Paper Abstract

The small, put-in, optical testing head described in the paper is available to detect the inner surface defects in a deep hole. It is composed of the following advanced techniques: CCD camera, step motor, grating displacement measurement unit, etc. It can be put in a hole thats diameter is larger than 40 mm and can scan in axial and diametrical directions, recording the image by intermittent CCD camera. The detecting position and image data can be memorized by computer to analyze and process. The resolution of the testing head is better than 0.04 mm.

Paper Details

Date Published: 1 April 1993
PDF: 5 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142040
Show Author Affiliations
Muxing Liu, Xian Institute of Technology (China)
Zhenying Liu, Xian Institute of Technology (China)
Qian Mi, Xian Institute of Technology (China)
Binghua Su, Xian Institute of Technology (China)

Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93
LiWei Zhou, Editor(s)

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