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Proceedings Paper

Theoretic analysis of photoelectronic-imaging delay
Author(s): Yisong Zou; Yudan Li; Shanfeng Hou
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Paper Abstract

There are some delay elements in photoelectronic imaging processes, such as phosphor screen, photoconductive target, etc., and these lead to the time delay. The former originates from the transience capture of carriers which is produced before recombination luminescence in the luminous crystal excited process, and the time dispersion of the electrons release in trap level determines the delay of the luminous delay process. Whereas, the latter originates from the lifetime dispersion of semiconductor minority carriers and the capacitive delay of scanning electron beam charging the target. It can be fairly well verified by theoretic analysis and experiment that photoelectronic imaging delay can be approximately divided into: proportionality functional delay type, exponential functional delay type, and hyperbolic functional delay type. The three kinds of delays have different temporal modulation transfer functions. In this paper, we give the concrete analysis of them.

Paper Details

Date Published: 1 April 1993
PDF: 7 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.141993
Show Author Affiliations
Yisong Zou, Beijing Institute of Technology (China)
Yudan Li, Beijing Institute of Technology (China)
Shanfeng Hou, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93
LiWei Zhou, Editor(s)

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