Proceedings Paper
Radiation-induced effects in acousto-optic devices| Format | Member Price | Non-Member Price |
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Paper Abstract
A brief report on an ongoing study concerned with the responses of acousto-optic modulators (AOMs) and deflectors (AODs) exposed to linearly accelerated electrons, gamma rays, and X rays is presented. The diffracted spatial intensities of PbMoO4, TeO2, and InP devices were observed to undergo displacements and attenuation. Discussions of radiation- induced temperature gradients and color center formation believed to be responsible for these effects are included.
Paper Details
Date Published: 6 April 1993
PDF: 8 pages
Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993);
Published in SPIE Proceedings Vol. 1794:
Integrated Optical Circuits II
Ka-Kha Wong, Editor(s)
PDF: 8 pages
Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993);
Show Author Affiliations
Edward W. Taylor, Air Force Phillips Lab. (United States)
Anthony D. Sanchez, Air Force Phillips Lab. (United States)
Steve A. DeWalt, Air Force Phillips Lab. (United States)
Richard J. Padden, Air Force Phillips Lab. (United States)
Anthony D. Sanchez, Air Force Phillips Lab. (United States)
Steve A. DeWalt, Air Force Phillips Lab. (United States)
Richard J. Padden, Air Force Phillips Lab. (United States)
S. P. Chapman, Air Force Phillips Lab. (United States)
Timothy W. Monarski, Air Force Phillips Lab. (United States)
Douglas M. Craig, Air Force Phillips Lab. (United States)
Daniel J. Page, Headquarters Defense Nuclear Agency/RAEE (United States)
Timothy W. Monarski, Air Force Phillips Lab. (United States)
Douglas M. Craig, Air Force Phillips Lab. (United States)
Daniel J. Page, Headquarters Defense Nuclear Agency/RAEE (United States)
Published in SPIE Proceedings Vol. 1794:
Integrated Optical Circuits II
Ka-Kha Wong, Editor(s)
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