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Proceedings Paper

Radiation-induced transmission loss of integrated optic waveguide devices
Author(s): Henning Henschel; Otmar Koehn; Hans Ulrich Schmidt
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Paper Abstract

The radiation sensitivity of different integrated optic (IO) devices was compared under standardized test conditions. We investigated four relatively simple device types made by four different manufacturers. The waveguide materials were proton exchanged LiTaO3, LiNbO3:Ti, Tl-diffused glass, and Ag-diffused glass, respectively. In order to standardize the irradiation parameters we followed the 'Procedure for Measuring Radiation-Induced Attenuation in Optical Fibers and Optical Cables' proposed by the NATO NETG as close as possible. In detail we made pulsed irradiations with dose values of about 500 rad*, 104 rad, and 105 rad, as well as continuous irradiations at a 60Co source with a dose rate of 1300 rad*/min up to a total dose of 104 rad. Device temperatures were about 22 degree(s)C, -50 degree(s)C, and +80 degree(s)C.

Paper Details

Date Published: 6 April 1993
PDF: 12 pages
Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993); doi: 10.1117/12.141873
Show Author Affiliations
Henning Henschel, Fraunhofer-Institut fuer Naturwissenschaftlich-Technische Trendana (Germany)
Otmar Koehn, Fraunhofer-Institut fuer Naturwissenschaftlich-Technische Trendana (Germany)
Hans Ulrich Schmidt, Fraunhofer-Institut fuer Naturwissenschaftlich-Technische Trendana (Germany)

Published in SPIE Proceedings Vol. 1794:
Integrated Optical Circuits II
Ka-Kha Wong, Editor(s)

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