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Proceedings Paper

Reliability and accelerated aging of LiNb03 integrated optic fiber gyro circuits
Author(s): Paul G. Suchoski Jr.; Gary R. Boivin
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Paper Abstract

This paper describes various reliability and accelerated aging tests that have been performed on LiNbO3 integrated optical FOG circuits fabricated by annealed proton exchange. Fully packaged devices have been temperature cycled 100 times from -65 to 125 C and subjected to 11 Grms random vibration with less than 0.5 dB variation in insertion loss. Potential failure mechanisms of LiNbO3 integrated optical circuits are discussed. Ten devices with passive 3-dB couplers have been aged at 150 C and tested every 1000 hr with little, if any, change in device performance.

Paper Details

Date Published: 5 March 1993
PDF: 10 pages
Proc. SPIE 1795, Fiber Optic and Laser Sensors X, (5 March 1993); doi: 10.1117/12.141273
Show Author Affiliations
Paul G. Suchoski Jr., United Technologies Photonics (United States)
Gary R. Boivin, United Technologies Photonics (United States)

Published in SPIE Proceedings Vol. 1795:
Fiber Optic and Laser Sensors X
Eric Udd; Ramon P. DePaula, Editor(s)

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