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Proceedings Paper

All-fiber compact near-field scanning optical microscope
Author(s): Pavel Tomanek; Michel Spajer
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Paper Abstract

For overcoming the classical limits of resolution in optical microscopy it is necessary to detect the diffracted signal from the small details of an object in the near field. These light waves interact with the object details and then can be used for determining the object topology. The solution consists of frustrating the evanescent field by means of optical fiber probes. In this present communication a new super-resolution scanning near-field optical microscope using a diode laser ((lambda) equals 1.3 micrometers ) and optical fibers is demonstrated to measure the samples with submicron structure in a noncontact manner. A reproducible method manufacturing of the fiber probes is proposed. First, results dealing with the characterization of the device are reported.

Paper Details

Date Published: 1 January 1993
PDF: 7 pages
Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.141003
Show Author Affiliations
Pavel Tomanek, Technical Univ. Brno (Czech Republic)
Michel Spajer, CNRS (France)

Published in SPIE Proceedings Vol. 1781:
Specification and Measurement of Optical Systems
Lionel R. Baker, Editor(s)

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