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Proceedings Paper

Photothermal measurement of temperature-dependent absorbance of infrared components
Author(s): Peter Eckardt; Heinz-Guenter Walther; W. Richter
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Paper Abstract

The absorbance of an Au/ZnS/Ge thin film system, Au/ZnS, Au/BaF2, Au/PbF2 film combinations, and of bulk Ge were measured as a function of increasing temperature in the infrared spectral range with a photothermal beam deflection (PBD) arrangement.

Paper Details

Date Published: 1 January 1993
PDF: 6 pages
Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140970
Show Author Affiliations
Peter Eckardt, Friedrich-Schiller-Univ. Jena (Germany)
Heinz-Guenter Walther, Friedrich-Schiller-Univ. Jena (Germany)
W. Richter, Friedrich-Schiller-Univ. Jena (Germany)

Published in SPIE Proceedings Vol. 1781:
Specification and Measurement of Optical Systems
Lionel R. Baker, Editor(s)

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