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Proceedings Paper

Phase detection deflectometry: an industrial solution for three-dimensional form measurement of aspheric and spheric surfaces
Author(s): Eric Durand; Jean-Marie Bacchus
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Paper Abstract

Angenieux has developed a device providing a fast, accurate, 3-D analysis of a large range of aspherical and spherical surfaces and wavefronts, from diamond turned IR components to molded or polished lenses and up to large astronomical mirrors. Measurements are achieved without the need for compensating tooling such as null-lenses or holograms.

Paper Details

Date Published: 1 January 1993
PDF: 9 pages
Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140969
Show Author Affiliations
Eric Durand, Etablissements Pierre Angenieux (France)
Jean-Marie Bacchus, Etablissements Pierre Angenieux (France)

Published in SPIE Proceedings Vol. 1781:
Specification and Measurement of Optical Systems
Lionel R. Baker, Editor(s)

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