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Proceedings Paper

Terrestrial solar spectral ultraviolet measurements at the National Renewable Energy Laboratory
Author(s): Daryl R. Myers; Theodore W. Cannon; John D. Webb
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Paper Abstract

At the National Renewable Energy Laboratory (NREL), ongoing projects investigate the use of ultraviolet (UV) energy as it applies to aqueous toxic waste purification, material degradation, and terrestrial spectral solar irradiance model development. These projects require knowledge of the UV spectral distribution of natural terrestrial sunlight and artificial sources rich in UV radiation. NREL has modified instrumentation to measure terrestrial solar spectral distributions from 250 to 400 nanometers (nm) at 1 nm intervals. It uses a band width of 2 nm, and a small double monochromator and photomultiplier (1P28) detector. The modified instrument measures artificial sources in the laboratory with up to 1000 times the intensity of natural solar UV radiation. This is done using coupled multiple integrating spheres and by limiting apertures to provide appropriate signal levels. A newly acquired UV spectroradiometer with good wavelength accuracy (0.3 nm) is used to calibrate broad-band solar UV monitoring detectors outdoors and against laboratory standards. Both the metrology and research applications of these UV spectral measurements require detailed uncertainty analyses, which show that uncertainty in the measurements is a strong function of wavelength below 350 nm. The major contributors to the uncertainty are wavelength drive accuracy, passband, detector noise, and calibration source uncertainty.

Paper Details

Date Published: 22 January 1993
PDF: 11 pages
Proc. SPIE 1764, Ultraviolet Technology IV, (22 January 1993); doi: 10.1117/12.140864
Show Author Affiliations
Daryl R. Myers, National Renewable Energy Lab. (United States)
Theodore W. Cannon, National Renewable Energy Lab. (United States)
John D. Webb, National Renewable Energy Lab. (United States)

Published in SPIE Proceedings Vol. 1764:
Ultraviolet Technology IV
Robert E. Huffman, Editor(s)

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