Proceedings Paper
Displacement measurement by the detection of contrast variation of a projected pattern| Format | Member Price | Non-Member Price |
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Paper Abstract
A system has been developed and tested for optical noncontact measurement of displacement. The system consists of a light source, an objective lens, a quadrant pattern and a quadrant photodiode. The principle is based on the detection of the contrast variation of the projected quadrant pattern as a function of defocus. This system has coaxial projection and observation axes and is hardly influenced by the color and inclination of the surface. The direction of displacement can be identified by using one pair of detectors. Experimental tests verify the principle of the method and some tests of the system in applications are tried with expected results.
Paper Details
Date Published: 15 February 1993
PDF: 4 pages
Proc. SPIE 1756, Interferometry: Applications, (15 February 1993); doi: 10.1117/12.140789
Published in SPIE Proceedings Vol. 1756:
Interferometry: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)
PDF: 4 pages
Proc. SPIE 1756, Interferometry: Applications, (15 February 1993); doi: 10.1117/12.140789
Show Author Affiliations
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Akiyoshi Tochigi, Tokyo Univ. of Agriculture and Technology (Japan)
Tsutomu Furuki, Tokyo Univ. of Agriculture and Technology (Japan)
Tsutomu Furuki, Tokyo Univ. of Agriculture and Technology (Japan)
Published in SPIE Proceedings Vol. 1756:
Interferometry: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)
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