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Proceedings Paper

An almost 'perfectly' diffuse, 'perfect' reflector for far-infrared reflectance calibration
Author(s): Sheldon M. Smith
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Paper Abstract

Specular and diffuse reflectance measurements made near normal incidence of two very rough, solid aluminum surfaces are presented for the wavelength range from 2.2 to 512 microns. The diffuse measurements made at nonspecular angles by two different detectors indicate that between 33 and 201 microns the reflectance of one surface is nearly Lambertian (isotropic) with a bidirectional reflectance distribution function (BRDF) value within 32 percent of the theoretical value of (1/pi)/sr for a perfectly diffuse, perfect reflector. Photometric reflectance spectra at the specular angle show that between 6.9 and 100 microns the specular BRDF of these surfaces is within 5 percent of the theoretical value of (1/pi)/sr. At longer wavelengths of 235, 320, and 512 microns the specular reflectance rapidly departs from that of a perfectly diffuse, perfect reflector. The two samples studied have rms surface roughnesses of 44 and 60 microns. A durable metal surface with these near perfect reflectance characteristics can be advantageously used in the FIR as a black-body source, the interior surface of an integrating sphere, and most especially as an absolute calibration standard. BRDF measurements at 40 deg incidence, though still highly diffuse, show a significant departure from Lambertian reflectance.

Paper Details

Date Published: 12 February 1993
PDF: 10 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140705
Show Author Affiliations
Sheldon M. Smith, Sterling Software, Inc. and NASA Ames Research Ctr. (United States)

Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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