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Proceedings Paper

Cooled silicon crystal monochromator test results
Author(s): Thomas W. Tonnessen; John R. Arthur
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Paper Abstract

High energy insertion devices, used as x-ray monochromators on synchrotron storage rings, require high performance cooling of the primary optic. Monocrystalline materials, such as silicon, inherently provide crystal lattice properties suitable for x-ray diffraction. Silicon, provides excellent thermal and structural properties as well. Free electron lasers also require high performance heat exchanger technology for mirrors. A highly efficient approach to cooling, called `pin post cell,' was developed and fully validated in silicon. However, an additional criteria is imposed on the optic when used as a diffractive crystal. The crystalline structure of the material must not be altered during any step of fabrication. A test program has been completed which evaluated the existing fabrication technology for crystal lattice distortion. X-ray diffraction test results are presented. Currently, we are fabricating an actively cooled crystal that will undergo dynamic testing on the CHESS F2 beamline later this summer.

Paper Details

Date Published: 25 February 1993
PDF: 6 pages
Proc. SPIE 1739, High Heat Flux Engineering, (25 February 1993); doi: 10.1117/12.140538
Show Author Affiliations
Thomas W. Tonnessen, Rockwell Power Systems (United States)
John R. Arthur, Stanford Univ. (United States)

Published in SPIE Proceedings Vol. 1739:
High Heat Flux Engineering
Ali M. Khounsary, Editor(s)

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