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Proceedings Paper

DC substitution methods in metrology
Author(s): Franz Hengstberger
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Paper Abstract

DC substitution methods are used for the measurement of a wide range of physical parameters across the whole electromagnetic spectrum. A summary is given of the principles involved with a view to alerting users of such techniques in the area of optical radiation measurement to related work in other areas of metrology. Because of the similarity of the methods, much useful information and insight can be gained from such a wider perspective. This applies to both the striking similarity of the techniques and the analysis of required instrumental corrections.

Paper Details

Date Published: 9 February 1993
PDF: 9 pages
Proc. SPIE 1712, 14th Symposium on Photonic Measurement, (9 February 1993); doi: 10.1117/12.140162
Show Author Affiliations
Franz Hengstberger, CSIR (South Africa)

Published in SPIE Proceedings Vol. 1712:
14th Symposium on Photonic Measurement
Janos Schanda; Tivadar Lippenyi, Editor(s)

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