
Proceedings Paper
Decenter and defocus for testing aspheric surfacesFormat | Member Price | Non-Member Price |
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Paper Abstract
Testing profiles of aspheric surfaces at various stages of figuring is essential, and a simple algorithm for finding the surface profile is very helpful. In order to find the wave front fourth order spherical aberration, a new algorithm resorting to decenter and defocus is presented here.
Paper Details
Date Published: 15 December 1992
PDF: 11 pages
Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139236
Published in SPIE Proceedings Vol. 1776:
Interferometry: Surface Characterization and Testing
Katherine Creath; John E. Greivenkamp, Editor(s)
PDF: 11 pages
Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139236
Show Author Affiliations
Der-Shen Wan, Chung-Shan Institute of Science and Technology (Taiwan)
Published in SPIE Proceedings Vol. 1776:
Interferometry: Surface Characterization and Testing
Katherine Creath; John E. Greivenkamp, Editor(s)
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