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Proceedings Paper

Efficient polarizers for infrared ellipsometry
Author(s): Karl Barth; Fritz Keilmann
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Paper Abstract

We have employed novel metal grid polarizers with improved polarization contrast to build a far-infrared rotating-analyzer ellipsometer. Using a step-tunable, optically pumped gas laser as the light source we can determine the complex dielectric function in the spectral range from 10 to 250 cm-1. A cryostat allows reflection measurements under flat angles of incidence between temperatures from 10 to 300 K. We present measurements on high-TCYBaCuO type ceramics.

Paper Details

Date Published: 11 December 1992
PDF: 9 pages
Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138809
Show Author Affiliations
Karl Barth, Max-Planck-Institut für Festkörperforschung (Germany)
Fritz Keilmann, Max-Planck-Institut fuer Festkoerperforschung (Germany)

Published in SPIE Proceedings Vol. 1746:
Polarization Analysis and Measurement
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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