Share Email Print

Proceedings Paper

Mueller matrix algorithms
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A method for the correction of systematic errors generated by large orientational and retardance errors in the polarization optics in the dual rotating retarder polarimeter is presented. Small orientational and retardance errors (<1 degree(s)) can lead to large errors in the measured Mueller matrix (> 10% in some matrix elements). We incorporate correction terms for large orientation and retardance errors into the dual rotating retarder data reduction algorithm. Using these data reduction algorithms and a calibration step, the associated systematic errors are calculated and removed from the measured Mueller matrix. This procedure is especially useful for spectral and multi-wavelength systems in which the retardance and often the orientation of the retarders are wavelength dependent. The equations, the procedure to calculate the orientations of the polarization elements and the retardances of the retardation elements, and the method to correct for any errors are presented here. The effect of these errors on the calculated Mueller matrix elements and their correction is shown analytically and through experimental data taken on an infrared spectropolarimeter.

Paper Details

Date Published: 11 December 1992
PDF: 16 pages
Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138793
Show Author Affiliations
David B. Chenault, Univ. of Alabama in Huntsville (United States)
J. Larry Pezzaniti, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 1746:
Polarization Analysis and Measurement
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?