Proceedings Paper
Design of the second-generation scanning photoemission microscope at the National Synchrotron Light Source| Format | Member Price | Non-Member Price |
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Paper Abstract
During the past few years, we have built and commissioned a scanning photoemission microscope (X1-SPEM). It was the first photoemission microscope to achieve submicron resolution. To improve the performance, we are designing a second generation instrument. The major changes in the instrument are the replacement of the home-made single pass cylindrical mirror analyzer (CMA) with a hemispherical sector analyzer (HSA) and the construction of a new chamber with a scheme to manipulate the zone plate and the order sorting aperture (OSA) with more flexibility. The design concepts and expected performance of the instrument are discussed.
Paper Details
Date Published: 13 January 1993
PDF: 6 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138745
Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)
PDF: 6 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138745
Show Author Affiliations
Cheng-Hao Ko, SUNY/Stony Brook (United States)
Harald Ade, SUNY/Stony Brook (United States)
Janos Kirz, SUNY/Stony Brook (United States)
Erik D. Johnson, Brookhaven National Lab. (United States)
Harald Ade, SUNY/Stony Brook (United States)
Janos Kirz, SUNY/Stony Brook (United States)
Erik D. Johnson, Brookhaven National Lab. (United States)
Steven L. Hulbert, Brookhaven National Lab. (United States)
Erik H. Anderson, Lawrence Berkeley Lab. (United States)
Dieter P. Kern, IBM Thomas J. Watson Research Ctr. (Germany)
Erik H. Anderson, Lawrence Berkeley Lab. (United States)
Dieter P. Kern, IBM Thomas J. Watson Research Ctr. (Germany)
Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)
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