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Proceedings Paper

Characterization of 3He area sensitive proportional counters at IPNS for SANS applications
Author(s): Pappannan Thiyagarajan; K. F. Bradley; Roy Kent Crawford; J. E. Epperson; Denis Wozniak; John M. Carpenter
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Paper Abstract

The Small Angle Diffractometer (SAD) at the Intense Pulsed Neutron Source (IPNS) utilizes a 20 X 20 cm2 Borkowski-Kopp type 3He position sensitive detector (PSD) which has reliably performed small-angle neutron scattering experiments for more than a decade. The pulsed-source based SAD employs a small, but fixed, sample-to-detector distance and a pulsed polychromatic neutron beam. The neutron energies are resolved through time-of- flight (TOF) measurements so that a much wider range of momentum transfer is probed in a single measurement compared to the range of spectrometers using monochromatic incident beams. However, the pulsed source requires a short sample-to-detector distance so that the detector covers a large solid angle, but with lower angular resolution, and this situation puts stringent demands on the spatial resolution of the detector. Previously, nonlinearities in the position encoding of detected neutrons required that the outer channels of the detector, representing 40% of the detector area, be discarded. This paper presents a technique to characterize both the position encoding and the position resolution of the entire detector so that the whole detector can be used for SANS measurements.

Paper Details

Date Published: 2 February 1993
PDF: 12 pages
Proc. SPIE 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications, (2 February 1993); doi: 10.1117/12.138664
Show Author Affiliations
Pappannan Thiyagarajan, Argonne National Lab. (United States)
K. F. Bradley, Massachusetts Institute of Technology (United States)
Roy Kent Crawford, Argonne National Lab. (United States)
J. E. Epperson, Argonne National Lab. (United States)
Denis Wozniak, Argonne National Lab. (United States)
John M. Carpenter, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 1737:
Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
John M. Carpenter; David B. Cline; Richard C. Lanza; David F. R. Mildner, Editor(s)

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