The ISIS Single Crystal Diffractometer SXD is a time-of-flight Laue instrument exploiting the pulsed nature of the ISIS beam along with large area detectors. This means that the data collected on SXD is in the form of reciprocal space volumes. The development of the large area position-sensitive detectors used on ISIS are outlined, and results obtained from both the Anger camera and later fiber-optic encoded scintillator detectors are used to illustrate the performance of these.

Date Published: 2 February 1993
PDF: 9 pages
Proc. SPIE 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications, (2 February 1993);

Published in SPIE Proceedings Vol. 1737:
Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
John M. Carpenter; David B. Cline; Richard C. Lanza; David F. R. Mildner, Editor(s)