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Proceedings Paper

Off-line real-time FTIR analysis of a process step in imipenem production
Author(s): Jhansi R. Boaz; Scott M. Thomas; Steven M. Meyerhoffer; Steven J. Staskiewicz; Joseph E. Lynch; Richard S. Egan; Dean K. Ellison
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Paper Abstract

We have developed an FT-IR method, using a Spectra-Tech Monit-IR 400 systems, to monitor off-line the completion of a reaction in real-time. The reaction is moisture-sensitive and analysis by more conventional methods (normal-phase HPLC) is difficult to reproduce. The FT-IR method is based on the shift of a diazo band when a conjugated beta-diketone is transformed into a silyl enol ether during the reaction. The reaction mixture is examined directly by IR and does not require sample workup. Data acquisition time is less than one minute. The method has been validated for specificity, precision and accuracy. The results obtained by the FT-IR method for known mixtures and in-process samples compare favorably with those from a normal-phase HPLC method.

Paper Details

Date Published: 14 August 1992
PDF: 15 pages
Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); doi: 10.1117/12.137752
Show Author Affiliations
Jhansi R. Boaz, Merck Research Labs. (United States)
Scott M. Thomas, Merck Research Labs. (United States)
Steven M. Meyerhoffer, Merck Research Labs. (United States)
Steven J. Staskiewicz, Merck Research Labs. (United States)
Joseph E. Lynch, Merck Research Labs. (United States)
Richard S. Egan, Merck Research Labs. (United States)
Dean K. Ellison, Merck Research Labs. (United States)

Published in SPIE Proceedings Vol. 1681:
Optically Based Methods for Process Analysis
David S. Bomse; Harry Brittain; Stuart Farquharson; Jeremy M. Lerner; Alan J. Rein; Cary Sohl; Terry R. Todd; Lois Weyer, Editor(s)

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