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Proceedings Paper

Environmental considerations for fiber optic remote sensing systems in on-line process monitoring
Author(s): Richard D. Driver; James N. Downing; M. L. Brubaker; John D. Stark; Lubos J. B. Vacha; Tracey L. Wilbourn
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Paper Abstract

Remote spectroscopic sensing in the infrared places tight constraints on measurement system stability and analog signal integrity. The stability of each component of the system needs to be considered, including detectors, electronics, fiber cables, spectrometer, optical components and light sources. A full discussion of the signal-to-noise limit of a fiber remote systems is given. The parameters affecting the ability of the system to be used for long term process sensing are reviewed. Environmental data is presented on the optical throughput stability of infrared fiber optics, fiber-optic cables and sensors with changing temperature. The effect of water and vibration on bare and protected infrared fibers is discussed. The measurement stability of each component of a FT-IR remote fiber-optic system is related to the final measurement stability of the complete system. It is shown that, within certain environmental limits, the signal-to-noise limit of the measurement may be realized with careful system configuration and calibration.

Paper Details

Date Published: 14 August 1992
PDF: 14 pages
Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); doi: 10.1117/12.137742
Show Author Affiliations
Richard D. Driver, Galileo Electro-Optics Corp. (United States)
James N. Downing, Galileo Electro-Optics Corp. (United States)
M. L. Brubaker, Galileo Electro-Optics Corp. (United States)
John D. Stark, Galileo Electro-Optics Corp. (United States)
Lubos J. B. Vacha, Galileo Electro-Optics Corp. (United States)
Tracey L. Wilbourn, Galileo Electro-Optics Corp. (United States)

Published in SPIE Proceedings Vol. 1681:
Optically Based Methods for Process Analysis
David S. Bomse; Harry Brittain; Stuart Farquharson; Jeremy M. Lerner; Alan J. Rein; Cary Sohl; Terry R. Todd; Lois Weyer, Editor(s)

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