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Proceedings Paper

Signal measurements of multilayer refractive write-once data storage media
Author(s): James H. Strickler; Watt W. Webb
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Paper Abstract

Multilayered refractive data storage allows serial optical recording at data densities exceeding 1012bits/cm3. Data may be recorded in a write once mode using two-photon excitation of a photopolymer film. Data is read with minimal cross-talk between layers by wavefront shearing interferometry, for example by differential interference contrast microscopy. The readout signal from such a multilayered refractive memory initially increases with the refractive index contrast. However, high index contrast may eventually lead to excessive scattering which could reduce signal quality. We report here an empirical method for quantitatively assessing the readout performance of multilayer refractive memory media using laser scanning differential interference contrast microscopy and simple image processing. Signal level distributions for a multilayered refractive write once data storage structure are presented.

Paper Details

Date Published: 13 August 1992
PDF: 8 pages
Proc. SPIE 1663, Optical Data Storage, (13 August 1992); doi: 10.1117/12.137569
Show Author Affiliations
James H. Strickler, Cornell Univ. (United States)
Watt W. Webb, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 1663:
Optical Data Storage
Donald B. Carlin; David B. Kay; Alfred A. Franken, Editor(s)

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