Share Email Print

Proceedings Paper

Talbot projected 3D profilometry by means of one-step phase-shift algorithms
Author(s): Ruowei Gu; Toru Yoshizawa
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A 3-D profiling system has been set up utilizing grating's self-imaging effects and one step phase-shift algorithms. In the system, the self-image of a linear grating is projected on a tested diffuse surface without any imaging lens, and then a phase deformed grating is generated on the surface corresponding to its shape. Arranging the deformed pattern to be imaged by a CCD camera at the magnification of 4 pixels per fringe period, the phases produced by surface shape can be extracted by arc tangent calculations with only one frame of fringe picture. An advanced phase ordered unwrapping algorithm, which can minimize the propagation of errors, is adopted for phase connections of 2(pi) jumps. We got the rms accuracy of 2(pi) /35 from 256 X 256 point phase measurements under 0.5 mW He-Ne laser illumination.

Paper Details

Date Published: 20 October 1992
PDF: 8 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132157
Show Author Affiliations
Ruowei Gu, Beijing Institute of Technology (China)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)

Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
Jumpei Tsujiuchi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?