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Proceedings Paper

X-ray imaging optics in Japan (Invited Paper)
Author(s): Takeshi Namioka; Koujun Yamashita; Masaki Yamamoto; Tadashi Matsushita; Sadao Aoki; Shigeru Sato
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Paper Abstract

Some results obtained as part of a multilaboratory research project entitled `x-ray imaging optics' are presented, with emphasis on a new generation of optical components and systems designed to operate in the soft x-ray (SXR) region. Included are discussions of optical constants for various thin-film materials in the SXR region, SXR multilayers, SXR microscopes, x-ray telescopes, and metrological instrumentation for testing and characterizing SXR optical elements.

Paper Details

Date Published: 20 October 1992
PDF: 15 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132124
Show Author Affiliations
Takeshi Namioka, Universities' Space Research Association (United States)
Koujun Yamashita, Institute of Space and Astronautical Science (Japan)
Masaki Yamamoto, Tohoku Univ. (Japan)
Tadashi Matsushita, National Lab. for High Energy Physics (Japan)
Sadao Aoki, Univ. of Tsukuba (Japan)
Shigeru Sato, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
Jumpei Tsujiuchi, Editor(s)

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