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Proceedings Paper

Computational diagnostics of electronic components
Author(s): A. V. Goncharsky; A. N. Matvienko; D. O. Savin; A. V. Yasko
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Paper Abstract

The great number of problems of computational diagnostics of electronic components can be formulated as tomographical problems with incomplete initial data. The standard methods of tomographical reconstruction can not be applied to solving problems of this kind. We have developed effective techniques for solving these problems on the basis of using some a priori information. We have used both information about compact support of distribution to be found and more hard a priori information--about laminar structure of the object under investigation. The obtained results demonstrate high efficiency of the developed techniques for computational diagnostics of electronic components.

Paper Details

Date Published: 3 November 1992
PDF: 10 pages
Proc. SPIE 1843, Analytical Methods for Optical Tomography, (3 November 1992); doi: 10.1117/12.131901
Show Author Affiliations
A. V. Goncharsky, Moscow State Univ. (Russia)
A. N. Matvienko, Moscow State Univ. (Russia)
D. O. Savin, Moscow State Univ. (Russia)
A. V. Yasko, Moscow State Univ. (Russia)

Published in SPIE Proceedings Vol. 1843:
Analytical Methods for Optical Tomography
Gennady G. Levin, Editor(s)

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