Share Email Print

Proceedings Paper

Optical sampling measuring of optical and electrical waveform with picosecond resolution
Author(s): V. L. Karaganov; Dmitry V. Kolomoitsev; V. A. Komov; Efrim L. Portnoi; N. M. Siniavsky; A. V. Chelnokov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Cross-correlation method of measuring the optical and electrical waveforms with picosecond time resolution is reported. Sampling pulses (duration 5 - 15 ps) were generated by injection AlGaAs laser. Electro-optical Pockels effect was used for electrical measurements, and sum- frequency generation was used for optical measurements.

Paper Details

Date Published: 30 November 1992
PDF: 5 pages
Proc. SPIE 1842, Mode-Locked Lasers and Ultrafast Phenomena, (30 November 1992); doi: 10.1117/12.131864
Show Author Affiliations
V. L. Karaganov, Institute of Electronics (Lithuania)
Dmitry V. Kolomoitsev, Institute of Electronics (Lithuania)
V. A. Komov, Institute of Electronics (Lithuania)
Efrim L. Portnoi, Institute of Electronics (Lithuania)
N. M. Siniavsky, Institute of Electronics (Lithuania)
A. V. Chelnokov, Institute of Electronics (Lithuania)

Published in SPIE Proceedings Vol. 1842:
Mode-Locked Lasers and Ultrafast Phenomena
Gregory B. Altshuler, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?