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Proceedings Paper

Automatic field emission tip conditioning system for the subangstrom resolution STEM
Author(s): Shengyang Ruan; Oscar H. Kapp
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Paper Abstract

An automatic computer-controlled system has been completed for conditioning cold field- emission tips in a new high resolution sextupole-corrected scanning transmission electron microscope (STEM). Using this system, a tip may be conditioned optimally and subsequently operated under careful control, extending its lifetime.

Paper Details

Date Published: 1 August 1992
PDF: 4 pages
Proc. SPIE 1778, Imaging Technologies and Applications, (1 August 1992); doi: 10.1117/12.130964
Show Author Affiliations
Shengyang Ruan, Univ. of Chicago (United States)
Oscar H. Kapp, Univ. of Chicago (United States)

Published in SPIE Proceedings Vol. 1778:
Imaging Technologies and Applications
Robert J. Heaston, Editor(s)

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