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Proceedings Paper

Inverting neutron reflection data
Author(s): Devinderjit Singh Sivia; Roger Pynn
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Paper Abstract

We describe a method that makes use of a magnetized substrate and polarized neutrons to determine a unique density profile from neutron reflectometry measurements. Numerical simulations indicate that the method is capable of detecting subtle features such as slowly varying density profiles.

Paper Details

Date Published: 23 November 1992
PDF: 6 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130640
Show Author Affiliations
Devinderjit Singh Sivia, Rutherford Appleton Lab. (United Kingdom)
Roger Pynn, Los Alamos National Lab. (United States)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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