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Proceedings Paper

Measurement of magnetic-field depth profile in superconducting niobium film by polarized neutron reflectometry
Author(s): Daniel A. Korneev; L. P. Chernenko; A. V. Petrenko; N. I. Balalykin; A. V. Skripnik
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Paper Abstract

The profile of the stationary magnetic field penetrating into the superconducting niobium films was measured by specular reflection of thermal polarized neutrons. At 4.9 K and at 500 Oe the field penetrates practically without attenuation into the depth of (xi) equals 28 nm near the vacuum boundary, which is connected with the nearsurface depression of the superconducting order parameter. Further, in the depth of the film, the attenuation corresponds to a London law with the decay constant (Lambda) equals 45 nm. The measurements are done on the polarized neutron spectrometer SPN at the IBR-2 pulsed reactor at Dubna.

Paper Details

Date Published: 23 November 1992
PDF: 4 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130636
Show Author Affiliations
Daniel A. Korneev, Joint Institute for Nuclear Research (Russia)
L. P. Chernenko, Joint Institute for Nuclear Research (Russia)
A. V. Petrenko, Joint Institute for Nuclear Research (Russia)
N. I. Balalykin, Joint Institute for Nuclear Research (Russia)
A. V. Skripnik, Joint Institute for Nuclear Research (Russia)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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