The Moscone Center
San Francisco, California, United States
2 - 7 February 2019
Conference 10925
Photonic Instrumentation Engineering VI
Tuesday - Thursday 5 - 7 February 2019
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Tuesday 5 February Show All Abstracts
Session 1:
Design, Development, and Fabrication of Photonic Instruments I
Tuesday 5 February 2019
1:30 PM - 3:00 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
Yakov Soskind, Apple Inc. (United States)
Optimization for as-built performance (Invited Paper)
Paper 10925-1
Time: 1:30 PM - 2:00 PM
Author(s): Kenneth E. Moore, Zemax, LLC (United States)
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Structural, thermal, and optical performance (STOP) analysis of the NASA Arcstone instruments
Paper 10925-2
Time: 2:00 PM - 2:20 PM
Author(s): Christine Buleri, Quartus Engineering Inc. (United States); Michael Kehoe, Resonon Inc. (United States); Constantine Lukashin, Trevor Jackson, NASA Langley Research Ctr. (United States); Jeff Beckman, Adam Curtis, Britney Edwards, Trevor Owen, Quartus Engineering Inc. (United States); Adam Phenis, AMP Optics, LLC (United States); Mike Stebbins, Resonon Inc. (United States)
Show Abstract
Physical-optics simulation of optical interferometry systems
Paper 10925-3
Time: 2:20 PM - 2:40 PM
Author(s): Site Zhang, LightTrans International UG (Germany); Rui Shi, Friedrich-Schiller-Univ. Jena (Germany); Christian Hellmann, Wyrowski Photonics UG (Germany); Frank Wyrowski, Friedrich-Schiller-Univ. Jena (Germany)
Show Abstract
Lens design using grid-based surface optimization
Paper 10925-4
Time: 2:40 PM - 3:00 PM
Author(s): Shawn C. Gay, Zemax, LLC (United States); Zachary Derocher, Ken Moore, Zemax (United States)
Show Abstract
Coffee Break 3:00 PM - 3:30 PM
Session 2:
Applications of Photonic Instruments
Tuesday 5 February 2019
3:30 PM - 5:40 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
Patrick C. Mock, RAM Photonics, LLC (United States)
Sub-nanosecond time-gated camera based on a novel current-assisted CMOS image sensor (Invited Paper)
Paper 10925-5
Time: 3:30 PM - 4:00 PM
Author(s): Thomas Lapauw, Hans Ingelberts, Thomas Van den Dries, Maarten Kuijk, Vrije Univ. Brussel (Belgium)
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Focus adjustable motion-blur compensation method using deformable mirror
Paper 10925-6
Time: 4:00 PM - 4:20 PM
Author(s): Tomohiko Hayakawa, Kenichi Murakami, Jerome Pitogo de Leon, Masatoshi Ishikawa, The Univ. of Tokyo (Japan)
Show Abstract
Active fiber-ring enhanced absorption gas spectroscopy using multi-longitudinal mode tunable laser in the NIR
Paper 10925-7
Time: 4:20 PM - 4:40 PM
Author(s): Mahmoud A. Selim, Ain Shams Univ. (Egypt); Yasser M. Sabry, Ain Shams Univ. (Egypt), Si-Ware Systems (Egypt); George A. Adib, Diaa Khalil, Ain Shams Univ. (Egypt)
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Photothermal microscopy characterization of multiphoton annealing of defects in thin-film coatings for high-power lasers
Paper 10925-9
Time: 4:40 PM - 5:00 PM
Author(s): Facundo Zaldívar Escola, Univ. de Buenos Aires (Argentina), Consejo Nacional de Investigaciones Científicas y Técnicas (Argentina); Nélida Mingolo, Univ. de Buenos Aires (Argentina); Oscar E. Martinez, Univ. de Buenos Aires (Argentina), Consejo Nacional de Investigaciones Científicas y Técnicas (Argentina); Jorge J. Rocca, Carmen S. Menoni, Colorado State Univ. (United States)
Show Abstract
Label-free 3D super-resolution nanoscope with large field-of-view
Paper 10925-10
Time: 5:00 PM - 5:20 PM
Author(s): Ivan Kassamakov, Tuomo Ylitalo, Anton Nolvi, Pekka Raatikainen, Riku Paananen, Edward Hæggström, Univ. of Helsinki (Finland)
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Multispectral imaging system for the structural analysis of highly transparent technical surfaces
Paper 10925-11
Time: 5:20 PM - 5:40 PM
Author(s): Florian Rudek, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany); Theresa Puder, Fraunhofer IWS Dresden (Germany), Technische Univ. Chemnitz (Germany); Christopher Taudt, Westsächsische Hochschule Zwickau (Germany); Peter Hartmann, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany)
Show Abstract
Wednesday 6 February Show All Abstracts
Session 3:
Metrological Instrumentation I
Wednesday 6 February 2019
8:30 AM - 10:10 AM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
James T. A. Carriere, Ondax, Inc. (United States)
Characterization of fiber optics with femtosecond-infrared fiber Bragg gratings for extreme applications
Paper 10925-12
Time: 8:30 AM - 8:50 AM
Author(s): Daniel Murphy, Peter Riley, Thomas Rugari, Gary Pickrell, Virginia Polytechnic Institute and State Univ. (United States); Brian Risch, Prysmian Group (United States); Steven Rountree, Matthew Davis, Luna Innovations Inc. (United States)
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Characterization of gradient index optical components using experimental ray tracing
Paper 10925-13
Time: 8:50 AM - 9:10 AM
Author(s): Tobias Binkele, Hochschule Bremen Univ. of Applied Sciences (Germany); Rebecca Dylla-Spears, Michael A. Johnson, Lawrence Livermore National Lab. (United States); David Hilbig, Mahmoud Essameldin, Thomas Henning, Friedrich Fleischmann, Hochschule Bremen Univ. of Applied Sciences (Germany)
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In-process monitoring of laser ablation on thin steel membranes by multispectral shape-from-shading
Paper 10925-14
Time: 9:10 AM - 9:30 AM
Author(s): Paul Philipp Jacobs, Christopher Taudt, Westsächsische Hochschule Zwickau (Germany); Bryan Nelsen, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany); Peter Hartmann, Westsächsische Hochschule Zwickau (Germany)
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Analysis of HIMAP polarimeter
Paper 10925-15
Time: 9:30 AM - 9:50 AM
Author(s): Juliana Mae Richter, Russell Chipman, College of Optical Sciences, The Univ. of Arizona (United States); Brian Daugherty, Airy Optics, Inc. (United States); David J. Diner, Annmarie Eldering, Jason J. Hyon, Jet Propulsion Lab. (United States); Meredith Kupinski, College of Optical Sciences (United States); Dejian Fu, Jet Propulsion Lab. (United States)
Show Abstract
Polarization sensing with metasurfaces
Paper 10925-16
Time: 9:50 AM - 10:10 AM
Author(s): Noah A. Rubin, Harvard John A. Paulson School of Engineering and Applied Sciences (United States); Gabriele D'Aversa, Harvard John A. Paulson School of Engineering and Applied Sciences (United States), Ecole Polytechnique Fédérale de Lausanne (Switzerland); Wei-Ting Chen, Zhujun Shi, Federico Capasso, Harvard John A. Paulson School of Engineering and Applied Sciences (United States)
Show Abstract
Coffee Break 10:10 AM - 10:40 AM
Session 4:
Metrological Instrumentation II
Wednesday 6 February 2019
10:40 AM - 12:00 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
James T. A. Carriere, Ondax, Inc. (United States)
Shack-Hartmann-based interferometer as an advantageous alternative to standard interferometry
Paper 10925-17
Time: 10:40 AM - 11:00 AM
Author(s): Xavier Levecq, Guillaume Dovillaire, Remy Juvenal, Lionel Nicolas, Imagine Optic SA (France)
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High-resolution wavefront phase sensor for silicon wafer metrology
Paper 10925-18
Time: 11:00 AM - 11:20 AM
Author(s): Juan Manuel Trujillo-Sevilla, Oscar Casanova Gonzalez, Sergio Bonaque-González, Wooptix, S.L. (Spain); Jan Gaudestad, Wooptix, S.L. (Spain); José Manuel Rodríguez Ramos, Wooptix, S.L. (Spain)
Show Abstract
Hartmann wavefront sensor in the hard x-ray range for easy metrology, alignment, and adaptive optics on x-ray beamlines
Paper 10925-19
Time: 11:20 AM - 11:40 AM
Author(s): Fabrice Harms, Martin Piponnier, Ombeline de la Rochefoucauld, Agathe Marmin, Guillaume Dovillaire, Xavier Levecq, Imagine Optic SA (France)
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Absolute calibration of a Shack-Hartmann wavefront sensor for measurements of wavefronts
Paper 10925-20
Time: 11:40 AM - 12:00 PM
Author(s): Alexander N. Nikitin, Ilya Galaktionov, Julia Sheldakova, Institute of Dynamics of Geospheres (Russian Federation); Alexis Kudryashov, Institute of Dynamics of Geospheres (Russian Federation), Moscow Polytechnic Univ. (Russian Federation); Dmitrii Denisov, Valerii Karasik, Alexey Sakharov, Nikolay Baryshnikov, Bauman Moscow State Technical Univ. (Russian Federation)
Show Abstract
Lunch/Exhibition Break 12:00 PM - 1:30 PM
Session 5:
Metrology, Characterization, and Fabrication of Photonic Instruments I
Wednesday 6 February 2019
1:30 PM - 3:10 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
James B. Breckinridge, Caltech (United States)
Thin-film characterization with a dual-channel dispersion-encoded imaging low-coherence interferometry approach
Paper 10925-21
Time: 1:30 PM - 1:50 PM
Author(s): Christopher Taudt, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany), TU Dresden (Germany); Marco Preuß, Fraunhofer IWS Dresden (Germany); Bryan Nelsen, Tobias Baselt, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany); Edmund Koch, TU Dresden (Germany); Peter Hartmann, Westsächsische Hochschule Zwickau (Germany), Fraunhofer IWS Dresden (Germany)
Show Abstract
Non-contact characterization of compound optical lenses using confocal microscopy and low-coherence interferometry
Paper 10925-22
Time: 1:50 PM - 2:10 PM
Author(s): Mohamed T. El-Haddad, Yuankai K. Tao, Vanderbilt Univ. (United States)
Show Abstract
Quantitative phase imaging for surface roughness measurements to demonstrate variation of quality factor in crystalline whispering-gallery mode resonators
Paper 10925-23
Time: 2:10 PM - 2:30 PM
Author(s): Maxime Jacquot, Institut Franche-Comte Electronique Mecanique Thermique et Optique (France), Univ. de Franche-Comté (France); Guoping Lin, Huazhong Univ. of Science and Technology (China); Aurélien Coillet, Lab. Interdisciplinaire Carnot de Bourgogne (France), Univ. de Franche-Comté (France); Souleymane Diallo, Laurent Larger, Institut Franche-Comte Electronique Mecanique Thermique et Optique (France), Univ. de Franche-Comté (France); Yanne Chembo, Institut Franche-Comte Electronique Mecanique Thermique et Optique (France), Georgia Tech - CNRS (United States)
Show Abstract
Chromatic line confocal technology in high-speed 3D surface-imaging applications
Paper 10925-24
Time: 2:30 PM - 2:50 PM
Author(s): Karri Niemelä, FocalSpec Oy (Finland)
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An economical solution for high-throughput low-noise multi-channel spectroscopy
Paper 10925-25
Time: 2:50 PM - 3:10 PM
Author(s): Nassim Rahimi, HORIBA Scientific (United States); Alain Price, HORIBA Instruments Inc. (United States); Askari Ghasempour, Xinhua Pan, Francis Ndi, HORIBA Scientific (United States)
Show Abstract
Coffee Break 3:10 PM - 3:40 PM
Session 6:
Metrology, Characterization, and Fabrication of Photonic Instruments II
Wednesday 6 February 2019
3:40 PM - 5:00 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
Patrick C. Mock, RAM Photonics, LLC (United States)
Precision metrology through wavelength-demultiplexed laser interferometry
Paper 10925-26
Time: 3:40 PM - 4:00 PM
Author(s): Zain Zaidi, Vala Fathipour, Connie Chang-Hasnain, Univ. of California, Berkeley (United States)
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Stress metrology for flexible and flat-panel display manufacturing
Paper 10925-27
Time: 4:00 PM - 4:20 PM
Author(s): Wei-Chun Hung, Raphael Morency, Wojtek J. Walecki, Frontier Semiconductor, Inc. (United States)
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Influence of numerical aperture (NA) on micro-reflectance spectroscopy
Paper 10925-28
Time: 4:20 PM - 4:40 PM
Author(s): Xinhua Pan, Nassim Rahimi, Askari Ghasempour, HORIBA Scientific (United States); Alain Price, HORIBA Instruments Inc. (United States); Francis Ndi, HORIBA Scientific (United States)
Show Abstract
Photonic-assisted network analyzer for high-throughput electronic device characterization
Paper 10925-29
Time: 4:40 PM - 5:00 PM
Author(s): Zhuoya Bai, Cejo K. Lonappan, Asad M. Madni, Bahram Jalali, Univ. of California, Los Angeles (United States)
Show Abstract
Session PWed:
Posters-Wednesday
Wednesday 6 February 2019
6:00 PM - 8:00 PM
Location: Marriott Marquis Hotel, Golden Gate Ballroom

Conference attendees are invited to attend the OPTO poster session on Wednesday evening. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field.

Poster Setup: Wednesday 10:00 AM – 5:00 PM
View poster presentation guidelines and set-up instructions at
http://spie.org/PWPosterGuidelines
Electro-optic-based pressure measurement and transmitter using lithium niobate (LiNbO3) Mach-Zehnder modulator for industrial application
Paper 10925-42
Time: 6:00 PM - 8:00 PM
Author(s): Yadvendra Singh, Sanjeev Kumar Raghuwanshi, Indian Institute of Technology (Indian School of Mines), Dhanbad (India)
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Polarized wavefront measurement using an electrically tunable focused plenoptic camera
Paper 10925-44
Time: 6:00 PM - 8:00 PM
Author(s): Zhaowei Xin, Dong Wei, Mingce Chen, Huazhong Univ. of Science and Technology (China); Xiaoya Wang, Siemens Ltd. (China); Xinyu Zhang, Haiwei Wang, Changsheng Xie, Huazhong Univ. of Science and Technology (China)
Show Abstract
New microcontroller unit improving stability and functionality of the optical chopper for atmospheric LIDAR
Paper 10925-45
Time: 6:00 PM - 8:00 PM
Author(s): Margaret M. Allard, Smith College (United States); Jens Lautenbach, Luis Quintero, Cornell Univ. (United States)
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Development of separation inspection technique for micro-cracks and particles using non-contact stress-induced light scattering method
Paper 10925-46
Time: 6:00 PM - 8:00 PM
Author(s): Yoshitaro Sakata, Nao Terasaki, National Institute of Advanced Industrial Science and Technology (Japan)
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Combination of lock-in detection with dual-comb spectroscopy
Paper 10925-47
Time: 6:00 PM - 8:00 PM
Author(s): Hidenori Koresawa, Kyuki Shibuya, Tokushima Univ. (Japan), Japan Science and Technology Agency (Japan); Akifumi Asahara, The Univ. of Electro-Communications (Japan), Japan Science and Technology Agency (Japan); Takeo Minamikawa, Tokushima Univ. (Japan), Japan Science and Technology Agency (Japan); Kaoru Minoshima, The Univ. of Electro-Communications (Japan), Japan Science and Technology Agency (Japan); Takeshi Yasui, Tokushima Univ. (Japan), Japan Science and Technology Agency (Japan)
Show Abstract
Microspectroscopy of nanomaterials, biological species, and live cells
Paper 10925-49
Time: 6:00 PM - 8:00 PM
Author(s): Jeffrey B. Oleske, Justin T. Cooper, Gerald Cairns, Antoine Varagnat, Andor Technology Ltd. (United States)
Show Abstract
Characterization of performance of back-illuminated SCMOS cameras versus conventional SCMOS and EMCCD cameras for microscopy applications
Paper 10925-50
Time: 6:00 PM - 8:00 PM
Author(s): Justin T. Cooper, Jeffery B. Oleske, Colin Coates, Marcin Barszczewski, Andor Technology Ltd. (United States)
Show Abstract
On-line temperature monitoring of power electronic converters with distributed fiber-optic sensors based on optical frequency domain reflectometry
Paper 10925-52
Time: 6:00 PM - 8:00 PM
Author(s): Ping Lu, National Energy Technology Lab. (United States); Viju Nair, Ritwik Chattopadhyay, Byron Beddingfield, North Carolina State Univ. (United States); Michael Buric, National Energy Technology Lab. (United States); Subhashish Bhattacharya, North Carolina State Univ. (United States); Paul Ohodnicki, National Energy Technology Lab. (United States)
Show Abstract
Rayleigh scattering signature based optical fiber identification method
Paper 10925-53
Time: 6:00 PM - 8:00 PM
Author(s): Yang Du, Leibniz-IPHT (Germany)
Show Abstract
Thursday 7 February Show All Abstracts
Session 7:
Design, Development, and Fabrication of Photonic Instruments II
Thursday 7 February 2019
8:40 AM - 10:20 AM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
Yakov Soskind, Apple Inc. (United States)
True OEM terahertz systems for industrial applications (Invited Paper)
Paper 10925-30
Time: 8:40 AM - 9:10 AM
Author(s): Nico Vieweg, Anselm Deninger, Patrick Leisching, TOPTICA Photonics AG (Germany)
Show Abstract
Multi-tone modulated continuous-wave (MTCW) lidar
Paper 10925-31
Time: 9:10 AM - 9:30 AM
Author(s): Rasul Torun, Mustafa Mert Bayer, Imam Uz Zaman, Ozdal Boyraz, Univ. of California, Irvine (United States)
Show Abstract
Performance analysis of linearly-swept frequency-modulated continuous-wave ladar (Invited Paper)
Paper 10925-32
Time: 9:30 AM - 10:00 AM
Author(s): Thomas DiLazaro, U.S. Army Night Vision & Electronic Sensors Directorate (United States); George Nehmetallah, The Catholic Univ. of America (United States)
Show Abstract
Wavelength-locking of a semiconductor laser using an electronic technique
Paper 10925-33
Time: 10:00 AM - 10:20 AM
Author(s): Kevin Mullaney, Jane Hodgkinson, Stephen Staines, Ralph Tatam, Cranfield Univ. (United Kingdom)
Show Abstract
Coffee Break 10:20 AM - 10:50 AM
Session 8:
Sensors and Ruggedized Systems
Thursday 7 February 2019
10:50 AM - 12:30 PM
Location: Room 54 (South Lower Mezzanine)
Session Chair:
Lynda E. Busse, U.S. Naval Research Lab. (United States)
Optimal UV fabrication of in-fiber partial reflectors for active mode-locking laser sensing head arrays
Paper 10925-34
Time: 10:50 AM - 11:10 AM
Author(s): Chang Hyun Park, Gyeong Hun Kim, Pusan National Univ. (Korea, Republic of); Hwi Don Lee, Gwangju Institute of Science and Technology (Korea, Republic of); Chang-Seok Kim, Pusan National Univ. (Korea, Republic of)
Show Abstract
Hybrid sensor based on microstructured hollow-core fiber for simultaneous measurement of strain and temperature
Paper 10925-35
Time: 11:10 AM - 11:30 AM
Author(s): Marta S. Ferreira, Leibniz-Institut für Photonische Technologien e.V. (Germany), Univ. de Aveiro (Portugal); Jörg Bierlich, Jens Kobelke, Leibniz-Institut für Photonische Technologien e.V. (Germany); João L. Pinto, Univ. de Aveiro (Portugal); Kay Schuster, Katrin Wondraczek, Leibniz-Institut für Photonische Technologien e.V. (Germany)
Show Abstract
A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications
Paper 10925-36
Time: 11:30 AM - 11:50 AM
Author(s): Waylin J. Wing, LumenFlow Corp. (United States); Jim Holmes, Nicholas Chiolino, Ozark Integrated Circuits, Inc. (United States); Paul Bourget, LumenFlow Corp. (United States); Sonia Perez, Matthew Barlow, A. Matt Francis, Ozark Integrated Circuits, Inc. (United States)
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Simulation study of optical detection of small particles by light scattering-type sensor with double-side mirror reflectors
Paper 10925-37
Time: 11:50 AM - 12:10 PM
Author(s): Kenya Nakai, Nozomi Enoki, Mitsubishi Electric Corp. (Japan)
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Vector Brillouin optical time-domain analysis with Raman amplification and optical pulse coding
Paper 10925-38
Time: 12:10 PM - 12:30 PM
Author(s): Ping Lu, Nageswara Lalam, Bo Liu, Michael Buric, Paul Ohodnicki, National Energy Technology Lab. (United States)
Show Abstract
Lunch/Exhibition Break 12:30 PM - 2:00 PM
Session 9:
Design, Development, and Fabrication of Photonic Instruments III
Thursday 7 February 2019
2:00 PM - 3:20 PM
Location: Room 54 (South Lower Mezzanine)
Session Chairs:
Lynda E. Busse, U.S. Naval Research Lab. (United States) ;
Yakov Soskind, Apple Inc. (United States)
Lens in a voice coil: a compact design approach for z-scanners (Invited Paper)
Paper 10925-39
Time: 2:00 PM - 2:30 PM
Author(s): Thomas Ruppel, SwissOptic AG (Switzerland); Ronald Andronico, Celera Motion (United States); Michael Deyerler, SwissOptic AG (Switzerland); Robert Mastromattei, Celera Motion (United States)
Show Abstract
A frequency-modulated laser interferometer for nanometer-scale position sensing at cryogenic temperatures
Paper 10925-40
Time: 2:30 PM - 2:50 PM
Author(s): Adam J. Christiansen, David A. Naylor, Ian T. Veenendaal, Brad G. Gom, Univ. of Lethbridge (Canada)
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Refractive nonmechanical beam-steering in the infrared (Invited Paper)
Paper 10925-41
Time: 2:50 PM - 3:20 PM
Author(s): Jason D. Myers, Jesse Frantz, Christopher Spillmann, U.S. Naval Research Lab. (United States); Robel Bekele, Univ. Research Foundation (United States); Jakub Kolacz, American Society for Engineering Education (United States); Henry Gotjen, Univ. Research Foundation (United States); Jawad Naciri, Jasbinder Sanghera, U.S. Naval Research Lab. (United States)
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