Beijing International Convention Center
Beijing, China
11 - 13 October 2018
Conference 10819
Optical Metrology and Inspection for Industrial Applications V
Thursday - Saturday 11 - 13 October 2018
Important
Dates
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Abstract Due:
16 May 2018

Author Notification:
2 July 2018

Manuscript Due Date:
12 September 2018

Conference
Committee
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Conference Chairs
  • Sen Han, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Instruments LLC (China)
  • Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan), 3D Associates (Japan)
  • Song Zhang, Purdue Univ. (United States)

Program Committee
  • Masato Aketagawa, Nagaoka Univ. of Technology (Japan)
  • Yasuhiko Arai, Kansai Univ. (Japan)
  • James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)
  • Yuanshen Cao, National Institute of Measurement and Testing Technology (China)
  • Garrett D. Cole, Crystalline Mirror Solutions, LLC (United States)
  • Yuegang Fu, Changchun Univ. of Science and Technology (China)
  • Qingying Jim Hu, Qi2 (United States)
  • Ming Jiang, Suzhou Univ. of Science and Technology (China)
  • Zhihua Jiang, Shanghai Institute of Measurement and Testing Technology (China)
  • Kazuhide Kamiya, Toyama Prefectural Univ. (Japan)
  • Katsuichi Kitagawa, Independent Consultant (Japan)
  • Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
  • Chao-Wen Liang, National Central Univ. (Taiwan)
  • Yuxiang Lin, ASML (United States)
  • Yasuhiro Mizutani, Osaka Univ. (Japan)
  • Yukitoshi Otani, Utsunomiya Univ. (Japan)

Program Committee continued...
  • Giancarlo Pedrini, Institut für Technische Optik (Germany)
  • Xiang Peng, Shenzhen Univ. (China)
  • Qian Kemao, Nanyang Technological Univ. (Singapore)
  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics (China)
  • H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
  • John C. Stover, The Scatter Works Inc. (United States)
  • Takamasa Suzuki, Niigata Univ. (Japan)
  • Toshitaka Wakayama, Saitama Medical Univ. (Japan)
  • Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China)
  • Jiangtao Xi, Univ. of Wollongong (Australia)
  • Jing Xu, Tsinghua Univ. (China)
  • Lianxiang Yang, Oakland Univ. (United States)
  • Dawei Zhang, Univ. of Shanghai for Science and Technology (China)
  • Hao Zhang, Tianjin Univ. (China)
  • Qican Zhang, Sichuan Univ. (China)
  • Zonghua Zhang, Hebei Univ. of Technology (China)
  • Ping Zhong, Donghua Univ. (China)
  • Ping Zhou, The Univ. of Arizona (United States)
  • Weihu Zhou, Academy of Opto-Electronics (China)

Thursday 11 October Show All Abstracts
Opening Ceremony and Plenary Session
Thursday 11 October 2018
8:30 AM - 12:10 PM
Location: Conv. Hall No. 2, Level 2

8:30 - 8:50: Opening Ceremony
8:50 - 8:55: Wang Daheng Award Ceremony
8:55 - 9:00: COS Fellow Recognition Ceremony
Forty years of study on quasi-phase-matching (Plenary Presentation)
Paper 10825-201
Time: 9:00 AM - 9:40 AM
Author(s): Shining Zhu, National Lab. of Solid State Microstructures, Nanjing Univ. (China)
Show Abstract
Laser technology in manufacturing at GE (Plenary Presentation)
Paper 10813-202
Time: 9:40 AM - 10:20 AM
Author(s): Marshall G. Jones, GE Global Research (United States)
Show Abstract
Tea/Coffee Break 10:20 AM - 10:50 AM
Extreme light to ELI and beyond: science of high-energy single-cycled lasers (Plenary Presentation)
Paper 10811-203
Time: 10:50 AM - 11:30 AM
Author(s): Gérard A. Mourou, DER-IZEST, École Polytechnique (France)
Show Abstract
Deciphering breast cancer through computer-aided diagnosis, big data, and machine learning (Plenary Presentation)
Paper 10820-204
Time: 11:30 AM - 12:10 PM
Author(s): Maryellen L. Giger, The Univ. of Chicago (United States)
Show Abstract
Lunch/Exhibition Break 12:10 PM - 1:30 PM
Session 1:
Optical Metrology Methods I
Thursday 11 October 2018
1:30 PM - 3:00 PM
Location: Room 305B
Session Chair:
Sen Han, Univ. of Shanghai for Science and Technology (China)
Quaternary gray-code phase unwrapping using two defocused binary patterns (Invited Paper)
Paper 10819-1
Time: 1:30 PM - 2:00 PM
Author(s): Qian Kemao, Xiaoyu He, Nanyang Technological Univ. (Singapore); Dongliang Zheng, Nanjing Univ. of Science and Technology (China)
Show Abstract
A new phase unwrapping method for phase shifting profilometry with object in motion
Paper 10819-3
Time: 2:00 PM - 2:15 PM
Author(s): Zhaoyi Jia, Lei Lu, Chunhua Zhu, Yinsen Luan, Henan Univ. of Technology (China); Jiangtao Xi, Univ. of Wollongong (Australia)
Show Abstract
Modulated rubidium-cesium laser system with dual wavelengths
Paper 10819-4
Time: 2:15 PM - 2:30 PM
Author(s): Qiang Yu, Shunyan Wang, Southwest Institute of Technical Physics (China); Niyaziaili Nulahemaiti, Xinjiang Univ. (China); Wei Zhang, Juhong Han, Guofei An, Southwest Institute of Technical Physics (China); Kang Dai, Xinjiang Univ. (China); He Cai, Southwest Institute of Technical Physics (China); Abai Alghazi, Xinjiang Univ. (China); You Wang, Southwest Institute of Technical Physics (China)
Show Abstract
Wafer defect classification below the optical resolution by the use of two dark-field microscopy images
(Canceled)
Paper 10819-7
Time: 2:45 PM - 3:00 PM
Author(s):
Show Abstract
Tea/Coffee Break 3:00 PM - 3:30 PM
Session 2:
Optical Metrology Methods II
Thursday 11 October 2018
3:30 PM - 4:30 PM
Location: Room 305B
Session Chairs:
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan) ;
Lianhua Jin, Univ. of Yamanashi (Japan)
Direct phase determination using simple phase lock loop for heterodyne displacement-measuring interferometers
Paper 10819-9
Time: 3:45 PM - 4:00 PM
Author(s): Thanh Dong Nguyen, Quang Anh Duong, Masato Higuchi, Wei Dong, Masato Aketagawa, Nagaoka Univ. of Technology (Japan)
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Robustness evaluation of the non-contact inner diameter measuring device with micrometer order accuracy
Paper 10819-10
Time: 4:00 PM - 4:15 PM
Author(s): Toshiyasu Mitsunari, Yuji Okamoto, Itta Nozawa, Kazunori Yamazaki, Sumitomo Heavy Industries, Ltd. (Japan)
Show Abstract
Polarization aberration measurement of lithographic tools
Paper 10819-11
Time: 4:15 PM - 4:30 PM
Author(s): Shuang Xu, Gongfa Li, Bo Tao, Yongxing Guo, Wuhan Univ. of Science and Technology (China)
Show Abstract
Friday 12 October Show All Abstracts
Session 3:
Optical Metrology Methods III
Friday 12 October 2018
8:15 AM - 10:00 AM
Location: Room 305B
Session Chairs:
Sen Han, Univ. of Shanghai for Science and Technology (China) ;
Xiangchao Zhang, Fudan Univ. (China)
Recent progress on high-speed 3D shape measurement with structured-light methods (Invited Paper)
Paper 10819-12
Time: 8:15 AM - 8:45 AM
Author(s): Song Zhang, Purdue Univ. (United States)
Show Abstract
Underground cavity measurement using a ring beam device
Paper 10819-14
Time: 8:45 AM - 9:00 AM
Author(s): Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan), Non-Profit Organization 3D Associates (Japan); Masafumi Hirata, Maeda Corp. (Japan); Yoshihisa Kamakura, Non-Profit Organization 3D Associates (Japan); Toshitaka Wakayama, Saitama Medical Univ. (Japan)
Show Abstract
Phase determination method for sinusoidal frequency/phase modulation displacement measuring interferometer
Paper 10819-15
Time: 9:00 AM - 9:15 AM
Author(s): Masato Higuchi, Dong Wei, Masato Aketagawa, Nagaoka Univ. of Technology (Japan)
Show Abstract
3D label free bio-transfer standards
Paper 10819-16
Time: 9:15 AM - 9:30 AM
Author(s): Miikka Järvinen, Tuomas Vainikka , Tapani Viitala, Univ. of Helsinki (Finland); Carlos Bermudez, Roger Artigas, Sensofar-Tech, S.L. (Spain); Anton Nolvi, Univ. of Helsinki (Finland); Pol Martinez, Sensofar-Tech, S.L. (Spain); Niklas Sandler, Edward Hæggström, Ivan Kassamakov, Univ. of Helsinki (Finland)
Show Abstract
2D refractive index field measurements in air in different pressure scenarios
Paper 10819-17
Time: 9:30 AM - 9:45 AM
Author(s): Rüdiger Beermann, Lorenz Quentin, Eduard Reithmeier, Markus Kästner, Leibniz Univ. Hannover (Germany)
Show Abstract
Tea/Coffee Break 10:00 AM - 10:30 AM
Session 4:
Optical Metrology Methods IV
Friday 12 October 2018
10:30 AM - 12:00 PM
Location: Room 305B
Session Chairs:
Song Zhang, Purdue Univ. (United States) ;
Jing Xu, Tsinghua Univ. (China)
High-speed 3D shape measurement using composite structured-light patterns and multiview system (Invited Paper)
Paper 10819-19
Time: 10:30 AM - 11:00 AM
Author(s): Wei Yin, Chao Zuo, Shijie Feng, Tianyang Tao, Qian Chen, Nanjing Univ. of Science and Technology (China)
Show Abstract
Fast 3D foot modeling based on simulated laser speckle projection stereo and silhouette
Paper 10819-21
Time: 11:15 AM - 11:30 AM
Author(s): Yunpeng Li, Tianjin Univ. (China); Fugen Zhang, Jiangsu Liangtao Data Technology Co., Ltd. (China); Baozhen Ge, Qingguo Tian, Tianjin Univ. (China)
Show Abstract
3D reconstruction of particle agglomerates using multiple scanning electron microscope stereo-pair images
Paper 10819-22
Time: 11:30 AM - 11:45 AM
Author(s): Stefan Töberg, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
Show Abstract
Semiconductor wafer surface defect inspection algorithm based on multi-frame differential image summation
Paper 10819-23
Time: 11:45 AM - 12:00 PM
Author(s): Qingguo Tian, Shuqi Xiao, Yuyan Duan, Xiaoting Gao, Wanxin Zhou, Tianjin Univ. (China)
Show Abstract
Lunch/Exhibition Break 12:00 PM - 1:30 PM
Session Post:
Poster Session
Friday 12 October 2018
1:00 PM - 2:30 PM
Location: Convention Hall 4 and 5 C/D

Conference attendees are invited to attend the poster session on Friday afternoon. Come view the posters, ask questions, and network with colleagues in your field. Authors of poster papers will be present to answer questions concerning their papers. Attendees are required to wear their conference registration badges to the poster session. Poster authors, view poster presentation guidelines at http://spie.org/PAPosterGuidelines.
Ambient aerosols identification based on polarization indices during a field test
Paper 10819-38
Time: 1:00 PM - 2:30 PM
Author(s): Sirui Chen, Nan Zeng, Dongjian Zhan, Yonghong He, Hui Ma, Graduate School at Shenzhen, Tsinghua Univ. (China)
Show Abstract
Multi-ring artifact for performance evaluation experiments on probing system combinations
Paper 10819-47
Time: 1:00 PM - 2:30 PM
Author(s): Sen Zhou, Jian Xu, Long Wang, Lei Tao, Yan Yu, Yueqing Ding, Chongqing Academy of Metrology and Quality Inspection (China)
Show Abstract
A timeline-based sampling method applied in National Institute of Metrology primary standard goniophotometer
Paper 10819-48
Time: 1:00 PM - 2:30 PM
Author(s): Weiqiang Zhao, Hui Liu, Jingyun Yan, Ying Su, Lin Jiang, National Institute of Metrology (China)
Show Abstract
Pose calibration of two cameras with non-overlapped field of view
Paper 10819-49
Time: 1:00 PM - 2:30 PM
Author(s): Sitao Yan, Zonghua Zhang, Nan Gao, Hebei Univ. of Technology (China)
Show Abstract
Automatic 3D visualization and paper pop-up parts fabrication of construction model by recognizing 2D image of floor plan
Paper 10819-51
Time: 1:00 PM - 2:30 PM
Author(s): Yuho Nobuhara, Shugo Nishioka, Toru Matsumoto, Kunio Sakamoto, Konan Univ. (Japan)
Show Abstract
Optical model of hyperparaboloid mirror surface measurment based on PMD method
Paper 10819-52
Time: 1:00 PM - 2:30 PM
Author(s): Qiaoqiao Ru, Tao Ma, Chao Chen, Soochow Univ. (China)
Show Abstract
Extraction of surface topography features of optical elements by contourlet transform
Paper 10819-54
Time: 1:00 PM - 2:30 PM
Author(s): Linfu Li, Guizhou Minzu Univ. (China); Jian-Jun Chen, Xinjiang Medical Univ. (China); Jinbao Huang, Guizhou Minzu Univ. (China)
Show Abstract
Selection of frequency domain filter based on match of different location-specific points
Paper 10819-55
Time: 1:00 PM - 2:30 PM
Author(s): Dong Wei, Kenta Enoki, Masato Aketagawa, Nagaoka Univ. of Technology (Japan)
Show Abstract
Quantitative reconstruction of 3D flow density fields by a direct computerized tomography method of BOS
Paper 10819-58
Time: 1:00 PM - 2:30 PM
Author(s): Lei Zhang, Yang Song, Xiangju Qu, Zhenhua Li, Anzhi He, Nanjing Univ. of Science and Technology (China)
Show Abstract
An improved SFS method for civil aviation engine 3D borescope inspection
Paper 10819-59
Time: 1:00 PM - 2:30 PM
Author(s): Long Ma, Jun Jia, Yanmin Hu, Yi Lyu, Xin Pei, Civil Aviation Univ. of China (China)
Show Abstract
A turbulence image restoration algorithm for subpixel position of location holes on nuclear fuel assemblies
Paper 10819-60
Time: 1:00 PM - 2:30 PM
Author(s): Wenjun Chen, Shanghai Univ. (China); Zheng Zheng, Shandong Nuclear Power Company Ltd (China); Zhang Zhen, Shanghai Univ. (China)
Show Abstract
An image enhancement method for visual inspection of nuclear fuel assemblies
Paper 10819-61
Time: 1:00 PM - 2:30 PM
Author(s): Holly Sheng, Shanghai Univ. (China); Zheng Zheng, Shandong Nuclear Power Company Ltd. (China); Zhen Zhang, Shanghai Univ. (China)
Show Abstract
Fourier transform profilometry based on convolution neural network
Paper 10819-62
Time: 1:00 PM - 2:30 PM
Author(s): Wenwei Zhou, Yang Song, Xiangju Qu, Zhenhua Li, Anzhi He, Nanjing Univ. of Science and Technology (China)
Show Abstract
Quantitative measurement of colored-fringe background oriented schlieren based on three-step phase shifting
Paper 10819-63
Time: 1:00 PM - 2:30 PM
Author(s): Yingwei Zhu, Yang Song, Xiangju Qu, Zhenhua Li, Anzhi He, Nanjing Univ. of Science and Technology (China)
Show Abstract
Accuracy evaluations of axial localisation algorithms in confocal microscopy
Paper 10819-64
Time: 1:00 PM - 2:30 PM
Author(s): Rongjun Shao, Weiqian Zhao, Lirong Qiu, Yun Wang, Ruirui Zhang, Beijing Institute of Technology (China)
Show Abstract
Calibration of monochromator wavelength based on continuous spectrum light source and Fourier transform spectroradiometer
Paper 10819-65
Time: 1:00 PM - 2:30 PM
Author(s): Changshi Wang, Beijing Institute of Technology (China); Yingwei He, Haiyong Gan, Guojin Feng, Junchao Zhang, National Institute of Metrology (China); Yingyi Gui, Beijing Institute of Technology (China); Limin Xiong, National Institute of Metrology (China); Taogeng Zhou, Lin Li, Beijing Institute of Technology (China)
Show Abstract
UV laser wavelength standard based on frequency doubling of He-Ne laser at 632.8 nm
Paper 10819-66
Time: 1:00 PM - 2:30 PM
Author(s): Jianbo Wang, Cong Yin, Jin Qian, Chunying Shi, Hanping Wang, Shan Cai, National Institute of Metrology (China)
Show Abstract
Surface measurement of axicon lens based on polarization phase-shifting interferometry
Paper 10819-67
Time: 1:00 PM - 2:30 PM
Author(s): Zhangfan Wei, Aijun Zeng, Qiao Yuan, Jingpei Hu, Huijie Huang, Shanghai Institute of Optics and Fine Mechanics (China)
Show Abstract
System development for morphological feature extraction and weight detection of melon seeds
Paper 10819-68
Time: 1:00 PM - 2:30 PM
Author(s): Cuiling Li, Qingchun Feng, Kai Jiang, Xiu Wang, Jian Song, Xinni Li, Beijing Research Ctr. of Intelligent Equipment for Agriculture (China), National Research Ctr. of Intelligent Equipment for Agriculture (China)
Show Abstract
Recovering camera response function for structural light reconstruction
Paper 10819-69
Time: 1:00 PM - 2:30 PM
Author(s): Haihua Cui, Zhaojie Li, Xiaodi Zhang, Wei Tian, Xiaosheng Cheng, Wenhe Liao, Nanjing Univ. of Aeronautics and Astronautics (China)
Show Abstract
Spectral-domain optical coherence tomography for conformal coating thickness measurement on printed circuit board
Paper 10819-70
Time: 1:00 PM - 2:30 PM
Author(s): Xiao Shao, Soochow Univ. (China); Xiaojun Yu, Northwestern Polytechnical Univ. (China); Xinjian Chen, Soochow Univ. (China); Linbo Liu, Nanyang Technological Univ. (Singapore); Zhaogen Chen, Jianhua Mo, Soochow Univ. (China)
Show Abstract
Improving the measurement accuracy of structured light 3D measurement system based on evaluating reliability of stripe center locating results
Paper 10819-72
Time: 1:00 PM - 2:30 PM
Author(s): Yang Bai, Qi Xue, Zhengzhou Univ (China); Huiying Ye, XiaoHong Sun, Zhengzhou Univ. (China); Zhao Wang, Xi'an Jiaotong Univ. (China)
Show Abstract
Contour positioning method for irregularly shaped workpiece applied to machine vision
Paper 10819-73
Time: 1:00 PM - 2:30 PM
Author(s): Yixuan Wang, Wei Li, Min Xia, Huazhong Univ. of Science and Technology (China)
Show Abstract
Method for calibrating transmitted wavefront at any wavelength by refractive index formula
Paper 10819-75
Time: 1:00 PM - 2:30 PM
Author(s): Qiyuan Zhang, Changchun University of Science and Technology (China); Sen Han, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Instruments LLC (China); Haoyu Wang, Univ. of Shanghai for Science and Technology (China); Quanzhao Wang, Suzhou H&L Instruments LLC (China)
Show Abstract
Session 5:
Optical Metrology Methods V
Friday 12 October 2018
2:30 PM - 4:15 PM
Location: Room 305B
Session Chairs:
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan) ;
Shuang Xu, Wuhan Univ. of Science and Technology (China)
Dimensional measurement of internal profile using the optical caliper (Invited Paper)
Paper 10819-24
Time: 2:30 PM - 3:00 PM
Author(s): Lianhua Jin, Nobuto Miyatsu, Eiichi Kondoh, Univ. of Yamanashi (Japan); Bernard Gelloz, Nagoya Univ. (Japan); Naobumi Kanazawa, Nak Co., Ltd. (Japan); Toru Yoshizawa, Non-Profit Organization 3D Associates (Japan)
Show Abstract
AM0 performance measurement of triple-junction GaInP/InGaAs/Ge solar cells by a compound light source
Paper 10819-25
Time: 3:00 PM - 3:15 PM
Author(s): Haifeng Meng, Limin Xiong, Junchao Zhang, Yingwei He, Bifeng Zhang, Chuan Cai, National Institute of Metrology (China)
Show Abstract
Compact lateral shearing interferometer based on circular modified Hartmann mask
Paper 10819-26
Time: 3:15 PM - 3:30 PM
Author(s): Changzhe Peng, Shanghai Institute of Optics and Fine Mechanics (China), Univ. of Chinese Academy of Sciences (China); Feng Tang, Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China); Abel Kamagara, Shanghai Institute of Optics and Fine Mechanics (China), Univ. of Chinese Academy of Sciences (China); Jie Li, Research Center of Laser Fusion, China Academy of Engineering Physics (China)
Show Abstract
Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement
Paper 10819-27
Time: 3:30 PM - 3:45 PM
Author(s): Songjie Luo, Niigata Univ. (Japan), Huaqiao Univ. (China); Osami Sasaki, Huaqiao Univ. (China), Niigata Univ. (Japan); Samuel Choi, Takamasa Suzuki, Niigata Univ. (Japan); Jixiong Pu, Huaqiao Univ. (China)
Show Abstract
Automatic control of LED light source for wafer height leveling in electron beam imaging systems
Paper 10819-28
Time: 3:45 PM - 4:00 PM
Author(s): Shiguang Li, Dongdong Xie, Zhipeng Wu, Institute of Microelectronics (China), Zhongke Jingyuan Electron Ltd. (China); Yinghao Yang, Zhongke Jingyuan Electron Ltd. (China); Jing Zhang, Chenxu Guo, Yiqiang Pi, Sixuan Xiao, North China Univ. of Technology (China)
Show Abstract
Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings
Paper 10819-29
Time: 4:00 PM - 4:15 PM
Author(s): Pengsong Zhang, Bolun Zhang, Danyi Wang, China Academy of Space Technology, BISEE (China); Shanping Jiang, China Academy of Space Technology (China); Wei Leng, China Academy of Space Technology, BISEE (China); Hongsong Li, Linhua Yang, China Academy of Space Technology (China)
Show Abstract
Session 6:
Optical Metrology Applications I
Friday 12 October 2018
4:15 PM - 5:30 PM
Location: Room 305B
Session Chairs:
Song Zhang, Purdue Univ. (United States) ;
Nan Zeng, Graduate School at Shenzhen, Tsinghua Univ. (China)
Robotic visual servoing using fringe projection profilometry (Invited Paper)
Paper 10819-30
Time: 4:15 PM - 4:45 PM
Author(s): Jing Xu, Gang Rao, Tsinghua Univ. (China); Zhe Chen, Beijing University of Posts and Telecommunications (China)
Show Abstract
Extraction of properties of individual component for the retarder-linear diattenuator-retarder system and its application
Paper 10819-31
Time: 4:45 PM - 5:00 PM
Author(s): Lianhua Jin, Eiichi Kondoh, Univ. of Yamanashi (Japan); Hiroyuki Kowa, Uniopt Co. Ltd. (Japan); Bernard Gelloz, Nagoya Univ. (Japan)
Show Abstract
Rotation axis estimation for the derotator calibration with machine vision measurement of the auxiliary laser
Paper 10819-32
Time: 5:00 PM - 5:15 PM
Author(s): Yongkai Yin, Bettina Altmann, Christian Pape, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
Show Abstract
Robust direct vision-based pose tracking using normalized mutual information
Paper 10819-33
Time: 5:15 PM - 5:30 PM
Author(s): Hang Luo, Christian Pape, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
Show Abstract
Saturday 13 October Show All Abstracts
Session 7:
Optical Metrology Applications II
Saturday 13 October 2018
8:15 AM - 10:00 AM
Location: Room 305B
Session Chairs:
Chao Zuo, Nanjing Univ. of Science and Technology (China) ;
Hua Liu, Luoyang Institute of Electro-Optical Equipment (China)
3D profile measurement by grating projection method using DMD and telecentric optical system (Invited Paper)
Paper 10819-34
Time: 8:15 AM - 8:45 AM
Author(s): Yukitoshi Otani, Utsunomiya Univ. (Japan)
Show Abstract
Digital sinusoidal fringe generation with defocusing for profilometry: exponential binary vs squared binary patterns
Paper 10819-35
Time: 8:45 AM - 9:00 AM
Author(s): Abel Kamagara, Xiangzhao Wang, Sikun Li, Changzhe Peng, Univ. of Chinese Academy of Sciences (China)
Show Abstract
Holistic dimensional measurement of sheet-bulk metal formed parts
Paper 10819-36
Time: 9:00 AM - 9:15 AM
Author(s): Sebastian Metzner, Tino Hausotte, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
Show Abstract
Application of hyperspectral imaging on aircraft damage inspection
Paper 10819-37
Time: 9:15 AM - 9:30 AM
Author(s): Yandy Ma, Anthony J. P. Mannion, Stephen O'Brien, Aviation Services Research Ctr. (Hong Kong, China)
Show Abstract
Novel methods for inspection of damage on airframes
Paper 10819-39
Time: 9:30 AM - 9:45 AM
Author(s): Wenjiang Guo, Anthony J. P. Mannion, Stephen O'Brien, Aviation Services Research Ctr. (Hong Kong, China)
Show Abstract
Quantitative measurement of embedding depth of internal defect using phase-shifting dual-observation digital shearography
Paper 10819-40
Time: 9:45 AM - 10:00 AM
Author(s): Guoqing Gu, Yancheng Institute of Technology (China); Xing Xu, Shenzhen Orbbec Co., Ltd. (China); Chengchun Qiu, Fei Zhang, Guizhong Xu, Yancheng Institute of Technology (China)
Show Abstract
Tea/Coffee Break 10:00 AM - 10:30 AM
Session 8:
Optical Metrology Applications III
Saturday 13 October 2018
10:30 AM - 12:00 PM
Location: Room 305B
Session Chairs:
Yukitoshi Otani, Utsunomiya Univ. (Japan) ;
Jun Ho Lee, Kongju National Univ. (Korea, Republic of)
Damping measurement using laser self-mixing interference with spectrum analysis
Paper 10819-41
Time: 10:30 AM - 10:45 AM
Author(s): Rui Wang, Yanbin Xiong, Teng Fen, Huiru Yang, Hanqiao Chen, Wencai Huang, Xiamen Univ. (China)
Show Abstract
Cylindrical surface measurement
Paper 10819-42
Time: 10:45 AM - 11:00 AM
Author(s): Sen Han, Univ. of Shanghai for Science and Technology (China); Peng Wu, Xin Huang, University of Shanghai for Science and Technology (China); Hao Sun, Changchun Univ. of Scie (China); Fang Wang, university of shanghai for science and technology (China)
Show Abstract
Precision measurement of specular spherical surfaces based on monoscopic phase measuring deflectometry
Paper 10819-43
Time: 11:00 AM - 11:15 AM
Author(s): Zhenqi Niu, Fudan University (China); Xiangchao Zhang, Xueyang Xu, Fudan Univ. (China); Yifan Zhu, Fudan University (China); Shaoliang Li, Wanliang Zhao, Shanghai Institute of Spaceflight Control Technology (China)
Show Abstract
Design of subwavelength grating polarizers to generate cylindrical vector beams
Paper 10819-45
Time: 11:30 AM - 11:45 AM
Author(s): Guozun Zhou, Northwestern Polytechnical Univ. (China); Weijian Tian, Yangtze Delta Region Institute of Tsinghua Univ. (China)
Show Abstract
850nm gain-switched pulse laser and its application in photon counting OTDR
Paper 10819-46
Time: 11:45 AM - 12:00 PM
Author(s): Bin Li, Qiang Zhou, Heng Zhou, Univ. of Electronic Science and Technology of China (China); You Wang, Southwest Institute of Technical Physics (China), Univ. of Electronic Science and Technology of China (China); Guangwei Deng, Yunxiang Wang, Hao Li, Ruiming Zhang, Kun Qiu, Univ. of Electronic Science and Technology of China (China); Haizhi Song, Southwest Institute of Technical Physics (China), Univ. of Electronic Science and Technology of China (China)
Show Abstract
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