San Diego Convention Center
San Diego, California, United States
1 - 5 August 2021
Conference OP301
Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education
Conference Committee
This conference is no longer accepting submissions.
Late submissions may be considered subject to chair approval. For more information, please contact Matt Novak.
Important Dates
Abstract Due:
3 February 2021
Post-Deadline Submissions are Currently Being Accepted.

Author Notification:
5 April 2021

Manuscript Due Date:
7 July 2021

Additional Conference Information
Call for
This conference is dedicated to celebrate Professor and Dean James C. Wyant’s extraordinary contributions and services to the fields of optical metrology and optics education. The focus of his research has been on applying the science of interferometry to precision metrology and sensing applications in various fields including computer-generated holograms, data storage, wavefront sensors for adaptive optics, optical fabrication, and optical system engineering.

Originally scheduled for Optics & Photonics 2020, this conference is not accepting new submissions at this time. The schedule of papers will be available when the Advanced Program is published,

Authors have submitted papers they believe have been inspired or enabled by Jim’s work. It is an opportunity to tell him how their lives have been impacted by their coming in contact with him. Anecdotal experiences and observations relating him to their work and life are encouraged.

Suggested topics for papers include, but are certainly not limited to:
  • Applied interferometry, holography, and speckle
  • Applications: phase-measuring, interferometric fringe analysis
  • Absolute calibration: flats, spheres, windows, etc.
  • Measurement of aspheres and freeforms
  • Diffractive/Holographic null correctors: computer generated hologram
  • Wavefront sensors
  • Figure, ripple, and roughness: power spectral density measurement and analysis
  • Mid-spatial-frequency optics errors: detection, characterization, effects, and mitigation
  • Testing in adverse environments: vibration, atmosphere, cryogenic, vacuum, etc.
  • Subsurface damage: detection, characterization, effects, and mitigation
  • Surface profilometry: optical and scanning probe
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