San Diego Convention Center
San Diego, California, United States
23 - 27 August 2020
Conference OP300
Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education
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Abstract Due:
12 February 2020

Author Notification:
20 April 2020

Manuscript Due Date:
29 July 2020

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This conference is dedicated to celebrate Professor and Dean James C. Wyant’s extraordinary contributions and services to the fields of optical metrology and optics education. The focus of his research has been on applying the science of interferometry to precision metrology and sensing applications in various fields including computer-generated holograms, data storage, wavefront sensors for adaptive optics, optical fabrication, and optical system engineering.

Authors should submit papers they believe have been inspired or enabled by Jim’s work. It is an opportunity to tell him how their lives have been impacted by their coming in contact with him. Anecdotal experiences and observations relating him to their work and life are encouraged.

Suggested topics for papers include, but are certainly not limited to:
  • applied interferometry, holography, and speckle
  • applications: phase-measuring, interferometric fringe analysis
  • absolute calibration: flats, spheres, windows, etc.
  • measurement of aspheres and freeforms
  • diffractive/Holographic null correctors: computer generated hologram
  • wavefront sensors
  • figure, ripple, and roughness: power spectral density measurement and analysis
  • mid-spatial-frequency optics errors: detection, characterization, effects, and mitigation
  • testing in adverse environments: vibration, atmosphere, cryogenic, vacuum, etc.
  • subsurface damage: detection, characterization, effects, and mitigation
  • surface profilometry: optical and scanning probe.
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