San Diego Convention Center
San Diego, California, United States
23 - 27 August 2020
Conference 11485
Reflection, Scattering, and Diffraction from Surfaces VII
Monday 24 August 2020
This conference is no longer accepting submissions.
Late submissions may be considered subject to chair approval. For more information, please contact Dawn Jackson.
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Abstract Due:
12 February 2020

Author Notification:
20 April 2020

Manuscript Due Date:
29 July 2020

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This conference will bring together the theory, modeling, measurement and applications for the reflection, scattering and diffraction of electromagnetic waves from the far ultraviolet through the far infrared. This meeting provides a forum for researchers, scientists, engineers, and systems designers to present recent results dealing with reflection, rough surface scattering, diffraction, and stray light for related applications.

Papers are solicited on, but not limited to, the following topics:
  • reflection, scattering and diffraction theory, modeling and analysis
  • advances in measurement methods, techniques and optical instrumentation
  • metrology standards and uncertainty evaluation
  • coherent effects, including surface plasmons, localization, speckle and speckle correlations, and spectral shifts
  • rough surface retrieval
  • surface roughness measurement with stylus and optical profilometry, STM, AFM, and near-field optical microscopes
  • scatterometry, reflectometry, and spectroscopic ellipsometry
  • Rayleigh scattering, velocimetry, transient grating spectroscopy, holography
  • bidirectional reflectance, transmittance and scatter distribution functions (BRDF, BTDF, and BSDF, respectively)
  • sources of scatter, including surface properties, particulate contamination, molecular contamination, and on-orbit effects
  • polarization analysis and measurement for scattering and diffraction
  • scattering models and measurements for computer graphics, machine vision, and non-conventional imagery (polarization imagery, 3D laser imagery)
  • novel modeling or analysis of system-level stray light effects in systems (diffractive optics, segmented/sparse aperture optics, hyperspectral imaging, etc.), including novel techniques for suppressing stray light and comparison of test and deployed results
  • light scattering methods and instruments for medical diagnosis including tissue optics
  • multispectral scatter from pharmaceutical and biomedical materials
  • signature analysis and processing of laser-radar and seeker data
  • micro/nano applications and optical systems
  • monitoring and inspection for additive manufacturing.
Optical reflection, scatter and diffraction are of significance for many applications such as detection of surface defects, determination of the contamination of optical systems, remote sensing, target recognition/discrimination, pharmaceutical production, medical diagnosis, food and agricultural product quality control, and telecommunications. Other engineering applications are the development and validation of parameterized BRDF models for rapid image simulation and rendering, the design of micro-structured surfaces for directional illumination and thermal control applications, and the use of scattering theory to guide paint and coating development. Polarizations of scattering and diffractions add more information to the BRDF for the above applications. Tissue optics is the field of tissue diagnostics and imaging which includes optical properties of tissues with strong (multiple) scattering; coherent effects in the interaction of laser radiation with tissues and cell flows; controlling of optical properties of tissues; polarized light interaction with turbid tissues and the optothermal and optoacoustic interaction of light with tissues; optical coherence tomography and heterodyning imaging; and tissue inelastic light scattering.

Comparison of theoretical results with experimental data is crucial to establishing the valid ranges and accuracies of models, so that an appropriate method can be applied with confidence to the determination of a variety of rough surface characteristics.

Optical probes for microelectronics manufacturing are gaining increasing importance. Many applications require the characterization of materials and devices, and test methodologies are also needed to characterize nano-sized particles including ceramics, metals, and alloys to make nano-crystalline structures.
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