Square Brussels Meeting Centre
Brussels, Belgium
16 - 19 April 2012
Conference 8430
Optical Micro- and Nanometrology
Monday - Wednesday 16 - 18 April 2012
Important
Dates
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Abstract Due:
7 November 2011

Author Notification:
25 January 2012

Manuscript Due Date:
19 March 2012

Conference
Committee
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Monday 16 April Show All Abstracts
Welcome and Introduction
Monday 16 April 2012
1:25 PM - 1:30 PM

Christophe Gorecki, Univ. de Franche-Comté (France)
Session HT1:
Hot Topics I
Monday 16 April 2012
8:30 AM - 11:55 AM
Location: Gold Hall

Photonics Europe 2012: Hot Topics Session I

Monday 16 April, 8:30 to 11:55 hrs
For details, please see page 10-13 in the printed programme or visit http://spie.org/x12297.xml
Session 1:
Holographic Techniques
Monday 16 April 2012
1:30 PM - 3:20 PM
Session 2:
Microstructure Metrology
Monday 16 April 2012
4:00 PM - 5:50 PM
Session PS1:
Posters--Monday
Monday 16 April 2012
5:45 PM - 7:15 PM

A poster session will be held on Monday 17.45 to 19.15. Posters will be on display after 10.00 Monday morning in the Conference Centre. Conference attendees are invited to attend the Photonics Europe poster session on Monday. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field. Authors of poster papers will be present to answer questions concerning their papers. Attendees are required to wear their conference registration badges to the poster sessions. Poster authors, view poster presentation guidelines and set-up instructions at http://spie.org/x34963.xml.
Tuesday 17 April Show All Abstracts
Session 3:
Inspection of Microsystems
Tuesday 17 April 2012
8:20 AM - 10:00 AM
Session 4:
3D Metrology
Tuesday 17 April 2012
10:40 AM - 1:10 PM
Session 5:
Topography and Surface Metrology
Tuesday 17 April 2012
2:20 PM - 3:40 PM
Session HT2:
Hot Topics II
Tuesday 17 April 2012
4:30 PM - 6:30 PM
Location: Gold Hall

Photonics Europe 2012: Hot Topics Session II

Tuesday 17 April, 16:30 to 18:30 hrs
For details, please see page 10-13 in the printed programme or visit http://spie.org/x12297.xml
Wednesday 18 April Show All Abstracts
Session 6:
Image Reconstruction and Signal Processing
Wednesday 18 April 2012
9:00 AM - 10:00 AM
Session 7:
Novel Microscopy
Wednesday 18 April 2012
10:40 AM - 11:40 AM
Session 8:
High Resolution Patterning and Metrology
Wednesday 18 April 2012
1:40 PM - 3:20 PM
Tuesday 18 September Show All Abstracts
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