Palais de la Musique et des Congrès
Strasbourg, France
22 - 26 April 2018
Product Demonstrations
Tuesday
24 April 2018
Nanoimprint Lithography for Manufacturing of Photonic Devices
Presenter: Dr. Martin Eibelhuber, EV Group (EVG) (Austria)
Date: Tuesday 24 April 2018
Time: 10:30 AM - 11:00 AM
Location: Hall RHIN
IR-enhanced Distance Image Sensors
Presenter: Laurent DEMEZET, Hamamatsu Photonics (France)
Date: Tuesday 24 April 2018
Time: 11:30 AM - 12:00 PM
Location: Hall RHIN
High near-infrared sensitivity: GE=85% (lambda=800 nm)-High near-infrared sensitivity: GE=65% (lambda=940 nm)-Improved tolerance to background light using Hamamatsu original circuit technology (five times improvement over previous products)
Direct Glasses-free 3D LED Wall Display
Presenter: Tibor Balogh, 3D Light Field LED Wall (Hungary)
Date: Tuesday 24 April 2018
Time: 12:30 PM - 1:00 PM
Location: Hall RHIN
Introduction of the new glasses-free light field 3D LED wall technology developed in EU Optintegral and Live-Ray projects; Benefits, market and investment opportunities.
3D microprinting of optical components
Presenter: Dr. Jochen Zimmer, Nanoscribe GmbH (Germany)
Date: Tuesday 24 April 2018
Time: 4:30 PM - 5:00 PM
Location: Hall RHIN
We will present the possibilities of using Nanoscribe’s 3D microprinting technology and highlight recent applications in the field of micro-optics. The technology allows for the straightforward printing of virtually any 3D object, with linewidths and line-distances down to 0.2 µm and 0.5 µm, respectively. At the same time, it allows for total sample sizes in the range of several millimeters. Thus, 2.5D prototypes and masters can be produced and iterated quickly, and complex 3D assemblies can be realized in a single process step.
Wednesday
25 April 2018
Large LBO Crystal Applications
Presenter: Ophelie Wagner, Cristal Laser S.A. (France)
Date: Wednesday 25 April 2018
Time: 10:30 AM - 11:00 AM
Location: Hall RHIN
>100 mm dia. LBO crystal now available for high intensity and high power lasers.
MIniature Fast Highly Sensitive Surface Plasmon Resonance Systems
Presenter: Prof. Ibrahim Abdulhalim, PhotonicSys Ltd. (Israel)
Date: Wednesday 25 April 2018
Time: 11:30 AM - 12:00 PM
Location: Hall RHIN
Photonicsys was established based on several innovative plasmonic biosensing concepts which improve the detection limit, enhance the penetration depth so that small and large bioentities can be detected using the same system with visible light and make self referenced measurement ofr higher stability. A simple and highly accurate reading methodology was developed which makes the system compact that can be fit under a microscope or easily integrated with spectroscopic measurement instruments. In this presentation we shall review all these concepts and the related products.
High Voltage for Miniature, low noise and precision applications
Presenter: Hafiz M. Khalid, XP Power (United Kingdom)
Date: Wednesday 25 April 2018
Time: 12:30 PM - 1:00 PM
Location: Hall RHIN
This presentation will go over our high voltage products for low noise, precision and size constrained applications.
Optical Characterization of thin films using Agilent Cary Universal Measurement System (UMS)
Presenter: Dr. Marcus Schulz, Agilent Technologies (France)
Date: Wednesday 25 April 2018
Time: 1:30 PM - 2:00 PM
Location: Hall RHIN
In this presentation it will be shown how the Agilent Cary UMS can be used to characterize thin film coatings by measuring transmittance and absolute reflectance under oblique angle. Moreover the technical aspects of the UMS will be presented to show how the UMS can be modified to cover a wide range of sample types and applications (bandpass filter, Cube beam splitter, diffraction gratings).
INNOVATION AWARDS
Presenter: , SPIE (United States)
Date: Wednesday 25 April 2018
Time: 3:00 PM - 3:30 PM
Location: Hall RHIN
Tunable and Swept Lasers for Industrial test and Medical imaging
Presenter: Andrea Geltrude, Santec Europe Ltd. (United Kingdom)
Date: Wednesday 25 April 2018
Time: 3:30 PM - 4:00 PM
Location: Hall RHIN
Santec Lasers have demonstrate high level of reliability and peculiar performances in the past 20 years, across several fields of application. Tunable Lasers have been developed to streamline photonic testing, providing a complete solution where high-speed analysis, high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-550) with a Santec optical power meter (MPM-200) and custom software, the complete Swept Test System optimizes WDL measurement for use in both R&D and production environments. Swept Lasers are the core of Santec OCT Technology. Developed in our Labs in collaboration with top Universities, Santec Swept sources are widely appreciated in the OCT world and have been integrated in medical devices (e.g. Biometers and Surgical systems) and industrial metrology systems (non invasive imaging). Combining our swept source together with Santec OCT instrumentation, the Santec IVS-2000 OCT Systems is able to perform fine measurements and and provide clear surface and cross section images.
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