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6 - 10 April 2020
Conference 11352
Optics and Photonics for Advanced Dimensional Metrology
Monday - Friday 6 - 10 April 2020
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Please note that all presentations throughout all Photonics Europe Digital Forum conferences will be available 6 - 10 April.
Wednesday 8 April Show All Abstracts
Session 1:
Measuring Complex Optical Systems and Components
Wednesday 8 April 2020
8:30 AM - 10:20 AM
Session Chair:
Peter J. de Groot, Zygo Corporation (United States)
Reconfigurable dynamic optical system design, test, and data analysis (Invited Paper)
Paper 11352-1
Author(s): Dae Wook Kim, Maham Aftab, Isaac L. Trumper, Logan R. Graves, Henry Quach, Hyukmo Kang, Hyemin Yoo, Andrew E. Lowman, Greg A. Smith, Matthew B. Dubin, Chang-Jin Oh, Wyant College of Optical Sciences (United States); Justin Hyatt, Christian Davila-Peralta, Steward Observatory, The Univ. of Arizona (United States); Heejoo Choi, Wyant College of Optical Sciences (United States)
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Accurate 3D coordinate measurement using holographic multipoint technique
Paper 11352-3
Author(s): Simon Hartlieb, Cihan Erol, Michael Tscherpel, Tobias Haist, Flavio S. Guerra, Wolfgang Osten, Michael Ringkowski, Oliver Sawodny, Univ. Stuttgart (Germany)
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Increasing the accuracy of imaging-based dimensional measurements
Paper 11352-4
Author(s): Tobias Haist, Adriana Steinitz, Flavio Guerra, Institut für Technische Optik (Germany)
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UV absorption mapping as subsurface damage inspection in transparent optical materials
Paper 11352-5
Author(s): Heidi Cattaneo, Roelene Botha, Carsten Ziolek, NTB Interstaatliche Hochschule für Technik Buchs (Switzerland)
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Session 2:
Extending the Limits of What Can be Measured
Wednesday 8 April 2020
10:50 AM - 12:20 PM
Session Chair:
Pascal Picart, Lab. d'Acoustique de l'Univ. du Maine (France)
Fabricating freeform optics: advances and gaps in freeform metrology (Invited Paper)
Paper 11352-6
Author(s): Jessica DeGroote Nelson, Matthew J. Brunelle, Todd F. Blalock, Jennifer Coniglio, Daniel R. Brooks, Ian Ferralli, Brian W. Myer, Optimax Systems, Inc. (United States)
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Optical topography measurement of steeply-sloped surfaces beyond the specular numerical aperture limit
Paper 11352-7
Author(s): Matthew Thomas, Rong Su, The Univ. of Nottingham (United Kingdom); Peter J. de Groot, Zygo Corporation (United States); Richard K. Leach, The Univ. of Nottingham (United Kingdom)
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Miniaturized dual-VCSEL-based multiple wavelength digital holography for robust and stabile optical metrology
Paper 11352-9
Author(s): Daniel Claus, Igor Alekseenko, Institut für Lasertechnologien in der Medizin und Messtechnik (Germany); Martin Grabherr, Priolas Gmbh (Germany); Raimund Hibst, Institut für Lasertechnologien in der Medizin und Messtechnik (Germany)
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Robot-assisted BRDF measurement and surface characterization of inhomogeneous freeform shapes
Paper 11352-10
Author(s): Nils Melchert, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Lunch/Exhibition Break 12:20 PM - 1:30 PM
Session 3:
State-of-the-Art Photogrammetry and Structured Light
Wednesday 8 April 2020
1:50 PM - 4:00 PM
Session Chair:
Richard K. Leach, The Univ. of Nottingham (United Kingdom)
Smart photogrammetry for three-dimensional shape measurement (Invited Paper)
Paper 11352-11
Author(s): Joe Eastwood, Hui Zhang, Mohammad Isa, Danny Sims-Waterhouse, Richard K. Leach, Samanta Piano, The Univ. of Nottingham (United Kingdom)
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Concept of a control system based on 3D geometry measurement for open die forging of large-scale components
Paper 11352-12
Author(s): Lorenz Quentin, Rüdiger Beermann, Kai Brunotte, Bernd-Arno Behrens, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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3D registration of multiple surface measurements using projected random patterns
Paper 11352-13
Author(s): Tim Betker, Lorenz Quentin, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Application of ISO 25178 part 600 metrological characteristics for fringe projection
Paper 11352-14
Author(s): George Gayton, The Univ. of Nottingham (United Kingdom)
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Affine structured light sensor for measurements through inspection windows: basic concept and direct calibration approach
Paper 11352-15
Author(s): Rüdiger Beermann, Lorenz Quentin, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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High-speed fringe projection for robot 3D vision system
Paper 11352-16
Author(s): Wen Guo, Charles R. Coggrave, Jonathan M. Huntley, Loughborough Univ. (United Kingdom); Harshana G. Dantanarayana, AMETEK Taylor Hobson Ltd. (United Kingdom); Pablo D. Ruiz, Loughborough Univ. (United Kingdom)
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Session HT2:
Hot Topics II
Wednesday 8 April 2020
4:30 PM - 6:05 PM
Computational microscopy (Conference Presentation) (Plenary Presentation)
Paper 11351-100
Author(s): Laura Waller, Univ. of California, Berkeley (United States)
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Seeing the unseen in patients: advancing disease prevention and treatment through microimaging (Plenary Presentation)
Paper 11362-100
Author(s): Guillermo J. Tearney, Massachusetts General Hospital (United States)
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The funding opportunities of the European Research Council (Conference Presentation) (Plenary Presentation)
Paper 11354-300
Author(s): Anna Grazia Mignani, European Research Council Executive Agency (Belgium), Istituto di Fisica Applicata "Nello Carrara" (Italy)
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Thursday 9 April Show All Abstracts
Session 4:
Optical Metrology in Practice
Thursday 9 April 2020
8:30 AM - 9:50 AM
Session Chair:
Richard K. Leach, The Univ. of Nottingham (United Kingdom)
Adaptive merging of large datasets of a 3D measuring endoscope in an industrial environment
Paper 11352-18
Author(s): Lennart Hinz, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Grazing incidence interferometry for testing rough aspherics: experimental results and data analysis
Paper 11352-19
Author(s): Sergej Rothau, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany); Klaus Mantel, Max-Planck-Institut für die Physik des Lichts (Germany); Norbert Lindlein, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
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Measurement technique of extended optical fibers with high precision
Paper 11352-20
Author(s): Alexey Tavleev, Yuriy D. Arapov, Pavel V. Kubasov, Pavel N. Yaroschuk, N.L. Dukhov All-Russian Scientific Research Institute of Automatics (VNIIA) (Russian Federation)
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Fast fringe analysis method using graphics processing unit acceleration for dynamic fault identification
Paper 11352-21
Author(s): Ankur Vishnoi, Rajshekhar Gannavarpu, Indian Institute of Technology Kanpur (India)
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Session 5:
Advanced Measuring Microscopes
Thursday 9 April 2020
10:50 AM - 12:20 PM
Session Chair:
Jürgen W. Czarske, TU Dresden (Germany)
Surface scattering and the 3D transfer characteristics of optical profilers (Invited Paper)
Paper 11352-22
Author(s): Jeremy Coupland, Nikolay Nikolaev, Loughborough Univ. (United Kingdom)
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Three-dimensional imaging confocal profiler without in-plane scanning
Paper 11352-23
Author(s): Pol Martínez, Carlos Bermudez, Cristina Cadevall, Aitor Matilla Ayala, Roger Artigas, Sensofar-Tech, S.L. (Spain)
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Interferometric measurements of mold-plate assemblies designed for high-volume manufacturing of aspheric microlenses
Paper 11352-24
Author(s): Jack DiSciacca, Richard Pultar, Xavier Colonna de Lega, Peter J. de Groot, Zygo Corporation (United States)
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Demonstration of aberration-robust high-frequency modulated differential confocal microscopy with an oscillating pinhole
Paper 11352-25
Author(s): Johannes Belkner, Martin Hofmann, Johannes Kirchner, Eberhard Manske, Technische Univ. Ilmenau (Germany)
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Lunch/Exhibition Break 12:20 PM - 1:30 PM
Session 6:
Deep Learning, Machine Learning, and Model-based Methods
Thursday 9 April 2020
1:30 PM - 3:20 PM
Session Chair:
Pietro Ferraro, Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" (Italy)
Phase retrieval with deep learning (Conference Presentation) (Invited Paper)
Paper 11352-26
Author(s): Guohai Situ, Fei Wang, Yaoming Bian, Shanghai Institute of Optics and Fine Mechanics (China)
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Model-based dimensional optical metrology
Paper 11352-27
Author(s): Jörg Bischoff, Technische Univ. Ilmenau (Germany); Tobias Pahl, Peter Lehmann, Univ. Kassel (Germany); Eberhard Manske, Technische Univ. Ilmenau (Germany)
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Cascaded machine learning model for reconstruction of surface topography from light scattering
Paper 11352-28
Author(s): Mingyu Liu, The Univ. of Nottingham (United Kingdom); Nicola Senin, Univ. of Nottingham (United Kingdom), Univ. Perugia (Italy)
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Deep learning-based speckle decorrelation denoising for wide-field optical metrology
Paper 11352-29
Author(s): Silvio Montrésor, Lab. d'Acoustique de l'Univ. du Maine (France); Marie Tahon, Antoine Laurent, Lab. d'Informatique de l'Univ. du Mans (France); Pascal Picart, Lab. d'Acoustique de l'Univ. du Maine (France)
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Model-based calibration routine for a triangulation sensor for inner radius measurements of cylindrical components
Paper 11352-30
Author(s): Rüdiger Beermann, Hagen Bossemeyer, Robin Diekmann, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Session 7:
Resolution, Ellipsometry, and Hyperspectral Imaging
Thursday 9 April 2020
3:50 PM - 6:00 PM
Session Chair:
Jean-François Vandenrijt, Ctr. Spatial de Liège (Belgium)
Measuring the spatial distribution of liquid crystal alignment and retardation using stokes polarimetry
Paper 11352-32
Author(s): Yannick Folwill, Hans Zappe, Univ. of Freiburg (Germany)
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Segmented wavefront metrology using multicolor PISTIL interferometry
Paper 11352-33
Author(s): Bastien Rouzé, Cindy Bellanger, ONERA (France); Patrick Lanzoni, Frédéric Zamkotsian, Lab. d'Astrophysique de Marseille (France); Jérôme Primot, ONERA (France)
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Resolution and computational strategy in wideband multiphoton microscopy illustrated with muscle imaging
Paper 11352-34
Author(s): Ali Abjaghou, Univ. de Limoges (France), XLIM (France); Claire Carrion, Laetitia Magnol, Univ. de Limoges (France); Claire Lefort, XLIM (France)
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Enhanced nanoform metrology by imaging Mueller matrix ellipsometry combined with plasmonic support structures (Conference Presentation)
Paper 11352-35
Author(s): Tim Käseberg, Physikalisch-Technische Bundesanstalt (Germany)
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Detailed characterization of a hyperspectral snapshot imager for full-field chromatic confocal microscopy
Paper 11352-36
Author(s): Robin Hahn, Tobias Haist, Freya-Elin Hämmerling, Institut für Technische Optik (Germany), Univ. Stuttgart (Germany); David Fleischle, Oliver Schwanke, Twip Optical Solutions GmbH (Germany); Otto Hauler, Karsten Rebner, Marc Brecht, Reutlingen Univ. (Germany); Wolfgang Osten, Institut für Technische Optik (Germany), Univ. Stuttgart (Germany)
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Super-resolution imaging through microspheres (Conference Presentation) (Invited Paper)
Paper 11352-31
Author(s): Stéphane Perrin, Lab. des sciences de l'Ingénieur, de l'Informatique et de l'Imagerie (France), Univ. de Strasbourg (France); Sylvain Lecler, Lab. des sciences de l'Ingénieur, de l'Informatique et de l'Imagerie (France), Institut National des Sciences Appliquées de Strasbourg (France); Paul C. Montgomery, Lab. des sciences de l'Ingénieur, de l'Informatique et de l'Imagerie, CNRS (France)
Show Abstract
Session PSWed:
Poster Session
Thursday 9 April 2020
6:00 PM - 8:00 PM

Conference attendees are invited to attend the Photonics Europe Poster Session on Wednesday 18.05 to 20.00 hrs. Posters will be on display after 10.00 Wednesday morning in the Conference Area Hallway. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field. Authors of poster papers will be present to answer questions concerning their papers. Attendees are required to wear their conference registration badges to the poster sessions. Poster authors, view poster presentation guidelines and set-up instructions at http://spie.org/x34963.xml.
The multichannel optical spectrometer for combustion processes control
Paper 11352-44
Author(s): Mikhail A. Vaganov, Vasily I. Kazakov, Julianna A. Novikova, Saint-Petersburg State Univ. of Aerospace Instrumentation (Russian Federation)
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Precision inspection of microcomponents freeform by Moiré interferometry
Paper 11352-45
Author(s): Saïd Meguellati, Univ. Ferhat Abbas de Sétif (Algeria)
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Design of a compact corneal topographer to characterize the shape of the cornea
Paper 11352-46
Author(s): Manuel Campos-García, Daniel Aguirre-Aguirre, Juan Salvador Pérez-Lomelí, Andrés Peña-Conzuelo, Oliver Huerta-Carranza, Univ. Nacional Autónoma de México (Mexico); Christian Camargo-Fierro, Instituto Politécnico Nacional (Mexico)
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White light interference microscopy system design
Paper 11352-48
Author(s): Sébastien Marbach, Christophe Cordier, Univ. de Strasbourg (France); Rémy Claveau, Univ. College London (United Kingdom); Thierry Engel, Paul C. Montgomery, Manuel Flury, Univ. de Strasbourg (France)
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Modeling the conical corneal null-screen topographer with the Fermat principle
Paper 11352-50
Author(s): Andrés Peña-Conzuelo, Manuel Campos-García, Univ. Nacional Autónoma de México (Mexico)
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Comprehensive ranging disambiguation for amplitude-modulated continuous wave laser scanner
Paper 11352-51
Author(s): Chao Zhang, Sifan Liu, Zheyuan Zhang, The Univ. of Tokyo (Japan); Neisei Hayashi, Tokyo Institute of Technology (Japan); Lei Jin, Sze Yun Set, Shinji Yamashita, The Univ. of Tokyo (Japan)
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3D images processing using acousto-optic Bragg diffraction
Paper 11352-52
Author(s): Krill V. Zaichenko, Boris S. Gurevich, Institute for Analytical Instrumentation (Russian Federation)
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In-process monitoring of a hole depth processed with femtosecond laser pulses in glass using swept-source optical coherence tomography
Paper 11352-53
Author(s): Satoshi Hasegawa, Utsunomiya Univ. (Japan); Masatoshi Fujimoto, Toshihisa Atsumi, Hamamatsu Photonics K.K. (Japan); Yoshio Hayasaki, Utsunomiya Univ. (Japan)
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Deep reinforcement learning for variability prediction in latent heat flux from low-cost meteorological parameters
Paper 11352-54
Author(s): Saon Banerjee, Bidhan Chandra Krishi Viswavidyalaya (India); Sawon Pratiher, Indian Institute of Technology Kharagpur (India); Subhankar Chattoraj, Univ. Jean Monnet Saint-Etienne (France); Rishabh Gupta, Indian Institute of Technology Kharagpur (India); Parthasarathi Patra, Heritage Institute of Technology, WB, India. (India); Barnali Saikia, SCS College of Agriculture, AAU, Rangamati, Dhubri, (India); Sudipta Thakur, Krishi Vigyan Kendra Kalyan (India); Soumen Mondal, Asis Mukherjee, Bidhan Chandra Krishi Viswavidyalaya (India)
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Analysis of the systematic and random errors in the conical corneal null-screen topographer
Paper 11352-56
Author(s): Andrés Peña-Conzuelo, Manuel Campos-García, Daniel Aguirre-Aguirre, Oliver Huerta-Carranza, Univ. Nacional Autónoma de México (Mexico)
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Robustness improvement for the calibration of stereo deflectometry based on a search algorithm
Paper 11352-57
Author(s): Yongjia Xu, Feng Gao, Xiangqian Jiang, Univ. of Huddersfield (United Kingdom)
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Optical sensor for drone coordinate measurements
Paper 11352-58
Author(s): Volodymyr N. Borovytsky, Dmytro Averin, National Technical Univ. of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute” (Ukraine)
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Velocity estimation from fringe contrast using lensless Fourier transform digital holography
Paper 11352-60
Author(s): Urvashi Jinwal, Surya Kumar Gautam, Athira T. Sivaaraj, Pramod Panchal, Dinesh Narayana Naik, Indian Institute of Space Science and Technology (India)
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Integration of an endoscopic fringe projection system into a milling machine for the regeneration of complex capital goods: a first prototype
Paper 11352-61
Author(s): Philipp Middendorf, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Phase calibration of a basic bright-field microscope for 3D metrology of transparent samples at the nanoscale
Paper 11352-62
Author(s): Daniel Migliozzi, Ecole Polytechnique Fédérale de Lausanne (Switzerland); Bingying Zhao, Karlsruher Institut für Technologie (Germany); Martin A. M. Gijs, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
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Picometer-resolved universal single-lens interferometer unveiling ultraprecise frugal devices (Conference Presentation)
Paper 11352-63
Author(s): Pooja Munjal, Kamal P. Singh, Indian Institute of Science Education and Research Mohali (India)
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Development of a double-diffraction grating interferometer for measurements of displacement and angle
Paper 11352-59
Author(s): Shao-Heng Chen, Hung-Lin Hsieh, Hong-Yi Chen, Yi-Xing Lai, National Taiwan Univ. of Science and Technology (Taiwan)
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Investigation on temporal phase shifting in digital shearography during transient process
Paper 11352-249
Author(s): Jay Krishna Ananad, Indian Institute of Space Science and Technology (India); Digendranath Swain, Binu P. Thomas, Vikram Sarabhai Space Ctr. (India); C. S. Narayanamurthy, Indian Institute of Space Science and Technology (India)
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Friday 10 April Show All Abstracts
Session HT3:
Hot Topics III
Friday 10 April 2020
9:00 AM - 9:50 AM
Ultrafast solid-state lasers: a success story for the last 30 years with no end in sight (Plenary Presentation)
Paper 11356-100
Author(s): Ursula Keller, ETH Zurich (Switzerland)
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Semiconductor devices for pure quantum light generation (Conference Presentation) (Plenary Presentation)
Paper 11347-100
Author(s): Pascale Senellart, Ctr. de Nanosciences et de Nanotechnologies (France)
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Session 8:
Optical Tomography
Friday 10 April 2020
11:00 AM - 12:30 PM
Session Chair:
Yoshio Hayasaki, Utsunomiya Univ. Ctr. for Optical Research & Education (Japan)
Optical coherence tomography in nondestructive testing (Conference Presentation) (Invited Paper)
Paper 11352-37
Author(s): Bettina Heise, Research Ctr. for Non Destructive Testing GmbH (Austria), Johannes Kepler Univ. Linz (Austria); Guenther Hannesschlaeger, Elisabeth Leiss-Holzinger, Ivan Zorin, Research Ctr. for Non Destructive Testing GmbH (Austria)
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Optical integration of time-of-flight measurement to optical coherence tomography for extending its operating range
Paper 11352-38
Author(s): Yoshio Hayasaki, Yuki Shimamoto, Shunya Masaki, Utsunomiya Univ. (Japan); Joel Cervantes, Univ. de Guadalajara (Mexico); QuangDuc Pham, National Ctr for Technical Progress (Viet Nam); Kei-ichiro Kagawa, Shizuoka Univ. (Japan); Hajime Nagahara, Osaka Univ. (Japan)
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Continuous arterial pulsation signal measurement using structured light projection method
Paper 11352-39
Author(s): Hui-Ting Chang, Chun-Hsiung Wang, National Taiwan Univ. (Taiwan); Shu-Sheng Lee, National Taiwan Ocean Univ. (Taiwan); Wen-Jong Wu, Chih-Kung Lee, National Taiwan Univ. (Taiwan)
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One-shot roughness measurements based on dispersion-encoded low coherence interferometry
Paper 11352-40
Author(s): Christopher Taudt, Tobias Baselt, Westsächsische Hochschule Zwickau (Germany), Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS (Germany); Bryan L. Nelsen, Westsächsische Hochschule Zwickau (Germany); Edmund Koch, TU Dresden (Germany); Peter Hartmann, Westsächsische Hochschule Zwickau (Germany)
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Lunch Break 12:30 PM - 1:40 PM
Session 9:
Quantitative Imaging: Joint Session
Friday 10 April 2020
1:40 PM - 3:30 PM
Session Chairs:
Pascal Picart, Lab. d'Acoustique de l'Univ. du Maine (France) ;
Corinne Fournier, Univ. Jean Monnet Saint-Etienne (France)

Joint Session between Conferences Unconventional Optical Imaging (11351) and Optics and Photonics for Advanced Dimensional Metrology (11352)
Note: this session runs concurrently with Session 14 in the Unconventional Optical Imaging Conference (11351).
Phase imaging with computational specificity (PICS) (Invited Paper)
Paper 11352-41
Author(s): Gabriel Popescu, Univ. of Illinois (United States)
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Scanning wavefront detection coherent Fourier scatterometry
Paper 11352-42
Author(s): Jörg Bischoff, Rostyslav Mastylo, Eberhard Manske, Technische Univ. Ilmenau (Germany)
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Visible and near-infrared spectral transmittance and scattering measurements of complex thin-film filters
Paper 11352-43
Author(s): Marin Fouchier, Institut Fresnel (France), Ctr. National d'Études Spatiales (France); Myriam Zerrad, Michel Lequime, Claude Amra, Institut Fresnel (France)
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Quantitative phase imaging for nanophotonics
Paper 11351-53
Author(s): Guillaume Baffou, Samira Khadir, Anne Sentenac, Serge Monneret, Institut Fresnel (France)
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11352 Additional Presentations
Friday 10 April 2020
4:00 PM - 4:50 PM
Accurate and low-cost ENEA solar compass for precision metrology of true azimuth: instrumental and smart versions (Conference Presentation)
Paper 11352-8
Author(s): Sarah Bollanti, Francesco Flora, Fabrizio Andreoli, Luca Mezi, ENEA (Italy); Lili Cafarella, Istituto Nazionale di Geofisica e Vulcanologia (Italy); Domenico De Meis, ENEA (Italy); Domenico Di Mauro, Istituto Nazionale di Geofisica e Vulcanologia (Italy); Gian Piero Gallerano, Paolo Di Lazzaro, Daniele Murra, ENEA (Italy); Luca Murra, Student (Italy); Davide Vicca, Giordano Vicoli, ENEA (Italy); Achille Zirizzotti, Istituto Nazionale di Geofisica e Vulcanologia (Italy)
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Optical system metrology vs. component metrology (Invited Paper)
Paper 11352-17
Author(s): Kate Medicus, Kenneth R. Castle, Tilman W. Stuhlinger, Jeremy Turner, Ruda-Cardinal, Inc. (United States)
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