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21 - 25 June 2021
Conference 11782
Optical Measurement Systems for Industrial Inspection XII
Conference Committee
Thursday 15 April Show All Abstracts
Welcome and Introduction
Welcome and Introduction to SPIE Conference 11782
Paper 11782-800
Author(s): Peter Lehmann, Univ. Kassel (Germany); Wolfgang Osten, Institut für Technische Optik (Germany); Armando Albertazzi Gonçalves, Univ. Federal de Santa Catarina (Brazil)
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Session PL: Optical Metrology Plenary Session
Location: Zoom
Optical sociology: how organizational culture impacts advances in optical metrology (Plenary Presentation)
Paper 11782-500
Author(s): Peter J. de Groot, Zygo Corporation (United States)
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Session 1: In-process and In-situ Measurement
Speckle photographic in-process measurement of three-dimensional deformations in running manufacturing processes
Paper 11782-1
Author(s): Andreas Tausendfreund, Dirk Stöbener, Andreas Fischer, Univ. Bremen (Germany)
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Intelligent quality monitoring for additive manufactured surfaces by machine learning and light scattering
Paper 11782-2
Author(s): Mingyu Liu, The Univ. of Nottingham (United Kingdom)
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Picometer spectrally stabilized dual-VCSEL source for snapshot multiple-wavelength digital holography
Paper 11782-3
Author(s): Daniel Claus, Igor Alekseenko, Institut für Lasertechnologien in der Medizin und Messtechnik (Germany); Martin Grabherr, Priolas Gmbh (Germany); Raimund Hibst, Institut für Lasertechnologien in der Medizin und Messtechnik (Germany)
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Fast 3D measurement method of complex surface based on multi-orientation speckle projection
Paper 11782-4
Author(s): Wentao He, Kai Zhong, Zhongwei Li, Huazhong Univ. of Science and Technology (China)
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Session 2: High-speed Technologies
Digital holography as a tool for high-speed high-precision 3D-measurements for industrial applications
Paper 11782-5
Author(s): Markus Fratz, Tobias Beckmann, Tobias Seyler, Alexander Bertz, Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany)
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High-speed electronic speckle pattern interferometry for analysis of thermo-mechanical behavior of electronic components
Paper 11782-6
Author(s): Gennadii Laskin, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany); Haosu Huai, Univ. of Freiburg (Germany); Markus Fratz, Tobias Seyler, Tobias Beckmann, Alexander Bertz, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany); Jürgen Wilde, Univ. of Freiburg (Germany); Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany)
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Critical imaging parameters in time-resolved digital image correlation (TRDIC): effect of optical blur during drop test on composite structures
Paper 11782-7
Author(s): Ahmed Boukar, Univ. de Montpellier (France), IMT Mines Alès (France), Lab. de mécanique et génie civil, CNRS (France); Patrick Ienny, Stephane Corn, Lab. de Mécanique et Génie Civil (France); Pierre R. Slangen, EuroMov Digital Health in Motion (France), Univ. de Montpellier (France), IMT Mines Alès (France)
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Structured-light 3D shape measurements using deep learning
Paper 11782-8
Author(s): Shijie Feng, Chao Zuo, Qian Chen, Nanjing Univ. of Science and Technology (China)
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Session 3: Displacement, Deformation, and Vibration Measurement
Speckle pattern modulation for high-resolution displacement measurements
Paper 11782-9
Author(s): Leon Schweickhardt, Andreas Tausendfreund, Dirk Stöbener, Andreas Fischer, Bremer Institut für Messtechnik, Automatisierung und Qualitätswissenschaft (BIMAQ) (Germany)
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Analyzing real-time capability of raw laser-Doppler vibrometer signal combination for signal diversity
Paper 11782-10
Author(s): Marvin Schewe, Christian Rembe, Technische Univ. Clausthal (Germany)
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Minimally invasive lensless fiber endoscopy using wavefront shaping for technical inspections and biomedicine
Paper 11782-11
Author(s): Johannes Gürtler, Elias Scharf, Robert Kuschmierz, Jürgen W. Czarske, TU Dresden (Germany)
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Full-field vibration measurements on a cantilever beam under impact using visible and infrared deflectometry
Paper 11782-12
Author(s): Stephane Boubanga Tombet, Telops Inc. (Canada); Olivier Robin, Alain Berry, Univ. de Sherbrooke (Canada); Vincent Farley, Telops Inc. (Canada); Patrick O'Donoughue, Kishan Prithipaul, Univ. de Sherbrooke (Canada)
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Speckle simulation tool for the design of laser-based displacement sensors
Paper 11782-13
Author(s): Ernst Csencsics, Tobias Wolf, Georg Schitter, Technische Univ. Wien (Austria)
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Session 4: Digital Holography
Tomography imaging based on three-color digital holography
Paper 11782-14
Author(s): Saoucene Hassad, Lab. d'Acoustique de l'Univ. du Maine, CNRS (France); Pascal Picart, Lab. d'Acoustique de l'Univ. du Maine (France); Kouider Ferria, Larbi Bouamama, Univ. Ferhat Abbas Sétif 1 (Algeria)
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Low-coherence digital holography for long-range object profilometer using double multireflection reference mirrors
Paper 11782-15
Author(s): Pham Quang, Vietnam National Univ. Hanoi (Vietnam); Yoshio Hayasaki, Utsunomiya Univ. Ctr. for Optical Research & Education (Japan)
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In-situ laser beam melting investigation with multiwavelength digital holography
Paper 11782-16
Author(s): Matthieu Piniard, Béatrice Sorrente, Gilles Hug, ONERA (France); Pascal Picart, Univ. du Maine (France)
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Holographic fingerprint as a morphological marker to identify microplastics
Paper 11782-17
Author(s): Vittorio Bianco, Pasquale Memmolo, Daniele Pirone, Francesco Merola, Lisa Miccio, Pietro Ferraro, Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" (Italy)
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Volume phase holographic grating-based digital holographic interferometer for measurement of temperature distribution and temperature fluctuations in diffusion flames
Paper 11782-18
Author(s): Vivek Rastogi, Varun Kumar, Satish K. Dubey, Gufran S. Khan, Indian Institute of Technology Delhi (India); Chandra Shakher, Instrument Design and Development Ctr. (India)
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Session 5: Measurement Uncertainty and Material Measures in 3D Microscopy
Virtual coherence scanning interferometer for surface measurement
Paper 11782-19
Author(s): Rong Su, Shanghai Institute of Optics and Fine Mechanics (China); Richard K. Leach, The Univ. of Nottingham (United Kingdom)
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Design, manufacturing, and evaluation of a continuous frequency band chirp material measure for surface topography instrument calibration
Paper 11782-20
Author(s): Matthias Eifler, Julian Hering, Georg von Freymann, Jörg Seewig, Technische Univ. Kaiserslautern (Germany)
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Structural accuracy of material measurements depending on manufacturing parameters in direct laser writing and external stress factors
Paper 11782-21
Author(s): Katja Gross, Matthias Eifler, Julian Hering, Georg von Freymann, Jörg Seewig, Technische Univ. Kaiserslautern (Germany)
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Session 6: 3D Microscopy
Fast and robust diffraction-based overlay metrology using dark-field digital holographic microscopy
Paper 11782-22
Author(s): Theodorus van Schaijk, Christos Messinis, Advanced Research Ctr. for Nanolithography (Netherlands), Vrije Univ. Amsterdam (Netherlands); Nitesh Pandey, Vasco Tenner, Armand Koolen, ASML Netherlands B.V. (Netherlands); Stefan Witte, Advanced Research Ctr. for Nanolithography (Netherlands), Vrije Univ. Amsterdam (Netherlands); Johannes de Boer, Vrije Univ. Amsterdam (Netherlands); Arie den Boef, ASML Netherlands B.V. (Netherlands), Advanced Research Ctr. for Nanolithography (Netherlands), Vrije Univ. Amsterdam (Netherlands)
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Compensating aberration-induced error in differential confocal microscopy
Paper 11782-23
Author(s): Johannes Belkner, Ingo Ortlepp, Uwe Gerhardt, Eberhard Manske, Technische Univ. Ilmenau (Germany)
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Metrological characterization of different methods for recovering an optically sectioned image by means of structured light
Paper 11782-24
Author(s): Pol Martínez, Sensofar-Tech, S.L. (Spain)
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Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain
Paper 11782-25
Author(s): Lucie Hueser, Peter Lehmann, Univ. Kassel (Germany)
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Local spectroscopic characterization of materials using coherence scanning interferometry
Paper 11782-26
Author(s): Paul C. Montgomery, Sébastien Marbach, Rémy Claveau, Manuel Flury, ICube (France)
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Spatial frequency domain representation of interferogram formation in coherence scanning interferometry
Paper 11782-27
Author(s): Marco Künne, Tobias Pahl, Peter Lehmann, Univ. Kassel (Germany)
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Session 7: Nondestructive Testing
Angstrom-accuracy multilayer thickness determination using optical metrology and machine learning
Paper 11782-28
Author(s): HyunSoo Kwak, KAIST (Korea, Republic of); Sungyoon Ryu, Suil Cho, SAMSUNG Electronics Co., Ltd. (Korea, Republic of); Junmo Kim, KAIST (Korea, Republic of); Yusin Yang, SAMSUNG Electronics Co., Ltd. (Korea, Republic of); Jungwon Kim, KAIST (Korea, Republic of)
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Spatial and temporal modulated thermal excitations for shearography nondestructive inspection of thick composites
Paper 11782-29
Author(s): Nan Tao, Andrei G. Anisimov, Roger M. Groves, Technische Univ. Delft (Netherlands)
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Diffraction grating sensor for modal and fatigue analysis of fast rotating composite structures
Paper 11782-30
Author(s): Julian Lich, Tino Wollmann, Angelos Filippatos, Maik Gude, Jürgen W. Czarske, Robert Kuschmierz, TU Dresden (Germany)
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Session 8: Interferometric Techniques
Advanced technology for the fabrication of optical microstructures and their interferometric characterization
Paper 11782-31
Author(s): Sara Coppola, Veronica Vespini, Giuseppe Nasti, Pietro Ferraro, Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" (Italy)
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Adaptation of classical Interferometry for measuring expansion coefficients of thin materials
Paper 11782-32
Author(s): Alejandro Palacios, Vincent Le Houérou, Univ. de Strasbourg (France)
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Nonlocal mean sparse principal component analysis method for speckle noise reduction
Paper 11782-33
Author(s): Yassine Tounsi, Univ. Chouaïb Doukkali (Morocco); Manoj Kumar, Kobe Univ. (Japan); Abdelkrim Nassim, Univ. Chouaïb Doukkali (Morocco); Fernando Mendoza-Santoyo, Centro de Investigaciones en Óptica, A.C. (Mexico); Osamu Matoba, Kobe Univ. (Japan)
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Session 9: Measurement/Characterization of Optical Components and Systems
High-precision waviness measurement of spherical and aspheric surfaces using a low-coherence interferometer
Paper 11782-34
Author(s): Klaus Freischlad, InterOptics, LLC (United States)
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Grazing incidence interferometry for testing rough aspherics: experimental results and data analysis
Paper 11782-35
Author(s): Sergej Rothau, Norbert Lindlein, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany); Klaus Mantel, Max-Planck-Institut für die Physik des Lichts (Germany)
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Design of algorithms suited to high spatial frequency deflectometry
Paper 11782-36
Author(s): Hugo Jonquiere, Safran Reosc (France)
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Time resolved characterization of stray light
Paper 11782-37
Author(s): Lionel Clermont, Marc P. Georges, Ctr. Spatial de Liège (Belgium); Wilfried Uhring, Univ. de Strasbourg (France)
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Session 10: Novel Sensor and Sensor Characterization I
Light scattering by gold nanoparticles cured in optical adhesive at optical fibre interfaces
Paper 11782-38
Author(s): Xiang Wang, Rinze Benedictus, Roger M. Groves, Technische Univ. Delft (Netherlands)
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Measurement accuracy and practical assessment of the lidar camera Intel RealSense L515
Paper 11782-39
Author(s): Andreas Martin Maximilian Breitbarth, Cornelius Hake, Gunther Notni, Technische Univ. Ilmenau (Germany)
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Ensemble cross-correlation for image retrieval from the intensity signal recorded by a single pixel
Paper 11782-40
Author(s): Stephan Ludwig, Giancarlo Pedrini, Wolfgang Osten, Institut für Technische Optik (Germany); Xiang Peng, Shenzhen Univ. (China)
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Session 11: Novel Sensor and Sensor Characterization II
On the development of a flexible borescope fringe projection system
Paper 11782-41
Author(s): Moritz von Wrangel, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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Roundness measurement with deflectometry: principles and first results
Paper 11782-42
Author(s): Armando Albertazzi Gonçalves, Marcos J. F. Carvalho, Celso L. N. Veiga, Univ. Federal de Santa Catarina (Brazil)
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High resolution Shack Hartmann wavefront sensor with linearized focal plane technique
Paper 11782-43
Author(s): Xavier Levecq, Pauline Treimany, Guillaume Dovillaire, Imagine Optic SA (France)
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Robust and subpixel accurate wavelet-based segmentation of laser lines formed by lenticular lenses
Paper 11782-44
Author(s): Hagen Bossemeyer, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany)
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On inherent spatio-spectral image distortion in AOTF-based imagers
Paper 11782-45
Author(s): Grigoriy N. Martynov, Alexander S. Machikhin, Alexey V. Gorevoy, Vitold E. Pozhar, Scientific and Technological Ctr. of Unique Instrumentation RAS (Russian Federation)
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Session 12: Fringe Projection, Structured Light, Triangulation, and Photogrammetry
Three-dimensional measurement using a shape from focus method applied on a context of structured light profilometry
Paper 11782-46
Author(s): Xiangjun Kong, Erwan Dupont, Al Hajjar Hani, Frédéric Lamarque, Univ. de Technologie Compiègne (France)
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Evaluating and propagating uncertainty in digital fringe projection systems
Paper 11782-47
Author(s): George Gayton, Mohammad A. Isa, The Univ. of Nottingham (United Kingdom); Rong Su, Shanghai Institute of Optics and Fine Mechanics (China); Richard K. Leach, The Univ. of Nottingham (United Kingdom)
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Impact of multireflections on measurement accuracy in the endoscopic 3D reconstruction of gearing geometries
Paper 11782-48
Author(s): Lennart Hinz, Leibniz Univ. Hannover (Germany)
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Learning-based fringe projection profilometry
Paper 11782-49
Author(s): Chao Zuo, Nanjing Univ. of Science and Technology (China)
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Inverse triangulation algorithm applied to laser triangulation system for cylindrical shaped objects
Paper 11782-50
Author(s): Sergio Augusto B. Petrovcic, Instituto Federal de Educação, Ciência e Tecnologia de Santa Catarina (Brazil); Pedro D. V. Buschinelli, Marco Antônio M. Cavaco, Tiago Loureiro Figaro da Costa Pinto, Univ. Federal de Santa Catarina (Brazil)
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Accuracy assessment of optical 3D measurements in hydrodynamic tunnel
Paper 11782-51
Author(s): Vladimir A. Knyaz, FSUE "State Research Institute of Aviation Systems" (Russian Federation)
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Session PS: Poster Session: Interferometric Techniques
Uncertainty evaluation of a 300 mm aperture vertical Fizeau interferometer
Paper 11782-52
Author(s): Yuntao Wang, Lei Chen, Chenhui Hu, Donghui Zheng, Chen Huang, Zhiyao Ma, Haiying Ma, Nanjing Univ. of Science and Technology (China)
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Remote sensing telescope corrector lens design for facilitating measurement of center thickness and air gaps of inner lens using low-coherence interferometry
Paper 11782-53
Author(s): Sheng-feng Lin, National Space Organization (Taiwan)
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Fizeau interferometer with double interference cavity for suppressing errors from vibration
Paper 11782-54
Author(s): Yi Zong, Jianxin Li, Mingliang Duan, Rihong Zhu, Nanjing Univ. of Science and Technology (China)
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Two-step iterative algorithm for phase-shifting interferometry in the presence of vibration
Paper 11782-55
Author(s): Mingliang Duan, Yi Zong, Rihong Zhu, Jianxin Li, Nanjing Univ. of Science and Technology (China)
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Thickness profiling of optical flat using wavelength-tuning and harmonic-iterative method
Paper 11782-56
Author(s): Sung Tae Kim, Yangjin Kim, Pusan National Univ. (Korea, Republic of)
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Suppression of spatially uniform error with interferometric Fourier analysis method
Paper 11782-57
Author(s): Jiwon Seo, Pusan National Univ. (Korea, Republic of); Wonjun Bae, Pusan National Univ (Korea, Republic of); Yangjin Kim, Pusan National Univ. (Korea, Republic of)
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Precise interferometric measurement of the silicon wafer surface using wavelength tuning and window function
Paper 11782-58
Author(s): Jurim Jeon, Sung Tae Kim, Yangjin Kim, Pusan National Univ. (Korea, Republic of)
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In-plane coplanarity measurement by circular grating Talbot interferometer
Paper 11782-59
Author(s): Shilpi Agarwal, Vivek Rastogi, Chandra Shakher, Indian Institute of Technology Delhi (India)
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Research on optical parameters measurement of parallel plates based on weighted multistep phase-shifting algorithm
Paper 11782-60
Author(s): Renhui Guo, Pingping Song, Chengxing Liu, Xin Yang, Zhiyao Yin, Nanjing Univ. of Science and Technology (China)
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Session PS: Poster Session: Digital Holography
Microscopic height measurements on moving objects with digital holography
Paper 11782-61
Author(s): Annelie Schiller, Tobias Beckmann, Markus Fratz, Alexander Bertz, Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany)
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Combined data from digital and classical holographic recording provides insight on early stages of strain soliton formation
Paper 11782-62
Author(s): Andrey V. Belashov, Anna A. Zhikhoreva, Yaroslav M. Beltukov, Irina V. Semenova, Ioffe Institute (Russian Federation)
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Digital holographic measurement system for use on multi-axis systems
Paper 11782-63
Author(s): Jonas Stevanovic, Tobias Seyler, Tobias Beckmann, Alexander Bertz, Daniel Carl, Fraunhofer-Institut für Physikalische Messtechnik IPM (Germany)
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Session PS: Poster Session: Light Scattering and Speckle Techniques
Surface roughness measurement using the generalized Harvey-Shack scattering theory and the K-correlation model
Paper 11782-64
Author(s): Yoshitaka Igarashi, Toshiyasu Mitsunari, Kazunori Yamazaki, Sumitomo Heavy Industries, Ltd. (Japan)
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Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces
Paper 11782-65
Author(s): Malte Nickel, Ubbo Ricklefs, Jochen Frey, Technische Hochschule Mittelhessen (Germany)
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Recognition of small areas of activity by pointwise intensity-based dynamic speckle analysis
Paper 11782-66
Author(s): Elena V. Stoykova, Nataliya Berberova, Blaga Blagoeva, Dimana Nazarova, Lian Nedelchev, Institute of Optical Materials and Technologies (Bulgaria); Alexander S. Machikhin, Scientific and Technological Ctr. of Unique Instrumentation RAS (Russian Federation)
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Session PS: Poster Session: 3D Imaging and Shape Measurement
A phase measuring deflectometry method for 3D surface reconstruction with polarization analysis
Paper 11782-67
Author(s): Ang Cai, Dayong Wang, Beijing Univ. of Technology (China); Juan Zhao, Shenzhen Institutes of Advanced Technology (China)
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A parallel memory efficient outlier detection algorithm for large unstructured point clouds
Paper 11782-68
Author(s): Daniel Sopauschke, Fraunhofer-Institut für Fabrikbetrieb und -automatisierung IFF (Germany); Christian Teutsch, Huawei Technologies Duesseldorf GmbH (Germany); Erik Trostmann, Dirk Berndt, Fraunhofer-Institut für Fabrikbetrieb und -automatisierung IFF (Germany)
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An optical-electronic system based on three cameras for increasing the accuracy of monitoring the spatial position of the railway track
Paper 11782-69
Author(s): Ngoc Tuan Pham, ITMO Univ. (Russian Federation)
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Algorithm for the automated analysis of the shape of objects located on the cutting table of industrial robotic systems
Paper 11782-70
Author(s): Evgeny A. Semenishchev, Vyacheslav V. Voronin, Moscow State Univ. of Technology "Stankin" (Russian Federation)
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Application of structured-light 3D reconstruction in virtual assembly
Paper 11782-71
Author(s): Youteng Wan, Juan Zhao, Ang Cai, Qi Wei, Jing Liu, Zhan Song, Shenzhen Institutes of Advanced Technology (China)
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Session PS: Poster Session: Deformation Measurement and Nondestructive Testing
Precision optical inspection of functional microsurface
Paper 11782-72
Author(s): Saïd Meguellati, Univ. Ferhat Abbas Sétif 1 (Algeria)
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Optical flow tracking of the intensity barycenter position in a frame sequence recorded during a tensile test to establish the XY-plane deformation map of a flat 3D printed sample
Paper 11782-73
Author(s): Bruno Serio, Univ. Paris Nanterre (France); Jean-Jacques Hunsinger, Univ. de Technologie de Belfort-Montbéliard (France); Ye Zhy, Univ. Paris Nanterre (France)
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Evaluation of picosecond ultrasonic technology for in-die measurements of metal depth in metal line array in 3D NAND process
Paper 11782-74
Author(s): Yanwei Liu, Andrew Zhang, Michael Meng, Quan Zhang, Yangtze Memory Technologies Co., Ltd. (China); Calvin Wang, Onto Innovation Inc. (China); Sicong Wang, Albert Li, Celina Chen, Yangtze Memory Technologies Co., Ltd. (China); Haydn Zhou, Yangtze Memory Technologies Co., Ltd. (Singapore)
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Multimatrix optic-electronic system for measuring mirror position of the large aperture telescope
Paper 11782-75
Author(s): Igor A. Konyakhin, Minh Hoa Tong, ITMO Univ. (Russian Federation)
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Reverse engineering of geometric models of advance milling cutters using optical measuring systems
Paper 11782-76
Author(s): Sergey N. Grigoriev, Vladimir A. Grechishnikov, Alexey B. Nadykto, Petr M. Pivkin, Moscow State Univ. of Technology "Stankin" (Russian Federation)
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Optic-electronic autocollimation system for measuring line and angular deformations
Paper 11782-77
Author(s): Igor A. Konyakhin, Dinh Duan Dang, ITMO Univ. (Russian Federation)
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A deep learning-based segmentation approach for material surface defects
Paper 11782-78
Author(s): Gaokai Liu, Northwestern Polytechnical Univ. (China)
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Reverse engineering of geometric models of advanced curved edge drills using optical measuring systems
Paper 11782-79
Author(s): Petr M. Pivkin, Vladimir A. Grechishnikov, Alexey B. Nadykto, Sergey N. Grigoriev, Moscow State Univ. of Technology "Stankin" (Russian Federation)
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Session PS: Poster Session: Spectroscopic Techniques
Identification of defects in sawn wood using hyperspectral vision techniques
Paper 11782-80
Author(s): Alicia Moreno, Ana J. López, Univ. da Coruña (Spain); Fabio M. Vincitorio, Univ. Tecnológica Nacional (Argentina); Alberto Ramil, Univ. da Coruña (Spain)
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Application of an optical spectroscopy methods to control the combustion of hydrocarbon gas in thermal power plants
Paper 11782-81
Author(s): Mikhail A. Vaganov, Veniamin Kitaev, Saint-Petersburg State Univ. of Aerospace Instrumentation (Russian Federation)
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Simulation and mid-infrared spectroscopy measurements of total emission radiated by hydrocarbon flames
Paper 11782-82
Author(s): Salim Sebai, Bruno Serio, Isabelle Ranc, Khanh-Hung Tran, Univ. Paris Nanterre (France)
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Determination of the size and shape of reverse micelles by Raman spectroscopy
Paper 11782-83
Author(s): Ivan V. Plastinin, M. V. Lomonosov Moscow State Univ. (Russian Federation); Sergey A. Burikov, Tatiana A. Dolenko, M. V. Lomonosov Moscow State Univ. (Russian Federation), Skobeltsyn Institute of Nuclear Physics (Russian Federation)
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Large-spot size diffuse reflectance FT-NIR spectral sensor for inhomogeneous samples
Paper 11782-84
Author(s): Mohamed Sadek, Shady R. Labib, Bassem Mortada, Mostafa Medhat, Tarek Zeinah, Ahmed Shebl, Ahmed Fadeel, Mina Gad, Botros George, Yasser M. Sabry, Bassam Saadany, Si-Ware Systems (Egypt)
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Improving noise resilience of the neural network solution of the Raman spectroscopy inverse problem in quality control of alcoholic beverages
Paper 11782-85
Author(s): Igor Isaev, Skobeltsyn Institute of Nuclear Physics (Russian Federation), M. V. Lomonosov Moscow State Univ. (Russian Federation); Sergey A. Burikov, Tatiana A. Dolenko, M. V. Lomonosov Moscow State Univ. (Russian Federation), Skobeltsyn Institute of Nuclear Physics (Russian Federation); Kirill A. Laptinskiy, Sergey Dolenko, Skobeltsyn Institute of Nuclear Physics, M. V. Lomonosov Moscow State Univ. (Russian Federation)
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Optical sensor for inorganic ions based on carbon quantum dots
Paper 11782-86
Author(s): Kirill A. Laptinskiy, Sergey A. Burikov, Galina Chugreeva, Maria Y. Khmeleva, Tatiana A. Dolenko, M. V. Lomonosov Moscow State Univ. (Russian Federation)
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Session PS: Poster Session: Advanced Optical Sensing
Self-learning-based detection via multiple microresonator imaging
Paper 11782-87
Author(s): Anton V. Saetchnikov, Ruhr-Univ. Bochum (Germany); Elina A. Tcherniavskaia, Vladimir A. Saetchnikov, Belarusian State Univ. (Belarus); Andreas Ostendorf, Ruhr-Univ. Bochum (Germany)
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Turn on transient effects and “pulse to pulse” energy stability measurements in fast and ultrafast lasers using a new generation of high-speed laser energy sensors
Paper 11782-88
Author(s): Sergio Pellegrino, Alberto Geramagnoli, Giacomo Crapella, LaserPoint Srl (Italy); Homeira Hashemi, Jale Schneider, Fraunhofer-Institut für Solare Energiesysteme ISE (Germany)
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Determination of the temperature measurement uncertainty of Sapphire fiber Bragg gratings for contact temperature metrology
Paper 11782-89
Author(s): René Eisermann, Stephan Krenek, Physikalisch-Technische Bundesanstalt (Germany); Tobias Habisreuther, Leibniz-Institut für Photonische Technologien e.V. (Germany); Viet Hoang Lai, Daniel Schmid, Steffen Rudtsch, Physikalisch-Technische Bundesanstalt (Germany)
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Implementation of multitask learning neural network architectures for robust industrial optical sensing
Paper 11782-90
Author(s): Francesca Venturini, Zürcher Hochschule für Angewandte Wissenschaften (Switzerland), TOELT LLC (Switzerland); Umberto Michelucci, TOELT LLC (Switzerland); Michael Baumgartner, Zürcher Hochschule für Angewandte Wissenschaften (Switzerland)
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