Several SPIE Fellows and members are among the 66 new U.S. National Academy of Engineering members elected for their contributions in engineering research, practice, and education. Honored for their achievements in optics and photonics were three SPIE Fellows and two members:
SPIE Fellow Robert Allen, senior manager in the advanced materials chemistry department at IBM Almaden Research Center, was acknowledged for his contributions in chemistries and materials for semiconductor manufacturing. Allen has contributed more than 60 papers to SPIE conferences and publications. He is on the advisory committee for SPIE Advanced Lithography and is a member of the conference program committee for "Advances in Resist Materials and Processing Technology."
NAE added SPIE Fellow James Coleman, director of the Semiconductor Laboratory at the University of Illinois - Urbana, for his extensive work with semiconductor lasers and photonics materials. Coleman is also an Intel Alumni Endowed Chair in Electrical and Computer Engineering and a professor of materials science and engineering. His work has led to 27 published papers with SPIE, and he has served as an instructor at SPIE conferences. Coleman won the 2011 SPIE Technical Achievement Award, which was presented at SPIE Photonics West 2012.
SPIE Member Steven DenBaars, Mitsubishi Chemical Professor in Solid State Lighting and Displays at the University of California, Santa Barbara, was elected for his contributions to gallium nitride-based materials and devices for solid state lighting and displays. He has contributed more than 40 papers to SPIE conferences.
SPIE Fellow James Fienup, senior scientist at the Laboratory for Laser Energetics and the Robert Hopkins professor of optics at the University of Rochester, earned NAE membership for his development and applications of phase retrieval algorithms. Fienup has published 32 papers with SPIE, nearly all presented at SPIE conferences. Fienup is a part of the conference program committee for SPIE Optics + Photonics.
SPIE member Norbert Pelc, professor and associate chair for research at Stanford University, received honors for his special work in the development of algorithms for MRI, CT, and hybrid X-ray/MRI imaging. He has published nearly 35 papers for SPIE conferences. Pelc was a keynote speaker at SPIE Medical Imaging where he also chaired a session on "3D Breast Imaging."
New additions to the NAE are known for pioneering new and developing fields of technology and for accomplishing major advancements or implementing new approaches to engineering education. NAE memberships are among the highest professional distinctions for professionals in the engineering industry.
Read the full press release from National Academy of Sciences.