Conferences & Exhibitions Calendar
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SPIE Optical Metrology 23 - 26 May 2011
ICM—International Conference Centre Munich
Munich, Germany

Proceedings on CD-ROM

Searchable CD-ROM with Multiple Conferences
CD-ROMs are now available within 8 weeks of the meeting.
PC, Macintosh, and Unix compatible.

Optical Metrology 2011
(Includes Vols.8082-8085)
Order No. CDS444 • Est. pub. July 2011
Meeting attendee: €125
Nonattendee member price: $ 245
Nonattendee nonmember price: $ 325