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Optical Metrology 2011
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SPIE Optical Metrology 23 - 26 May 2011
ICM—International Conference Centre Munich
Munich, Germany

Conferences

See full details of conferences offering the latest in optical metrology.

Optical Measurement Systems for Industrial Inspection (Conference 8082)
Modeling Aspects in Optical Metrology (Conference 8083)
O3A: Optics for Arts, Architecture, and Archaeology (Conference 8084)
Videometrics, Range Imaging, and Applications (Conference 8085)

Important Dates

Abstract Due Date
16 December 2010

Author Notification
18 February 2011

Onsite Manuscripts Due 
14 March 2011

Post-Meeting Manuscripts Due
25 April 2011


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